2010
DOI: 10.1016/j.jallcom.2010.06.155
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Structure and electrical response of CaCu3Ti4O12 ceramics: Effect of heat treatments at the high vacuum

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Cited by 22 publications
(4 citation statements)
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“…Although the process is able to produce high dielectric constant CCTO, the dielectric loss is relatively high. At present, the sol-gel synthesis of CCTO ceramics and films is becoming increasingly popular [16][17][18][19][20][21][22][23][24][25]. Elemental substitution which can often change the crystal structure and electronic structure is a common method in materials research, it may be used to assist with the understanding of the origin of giant dielectric constant observed in CCTO ceramics.…”
Section: Introductionmentioning
confidence: 99%
“…Although the process is able to produce high dielectric constant CCTO, the dielectric loss is relatively high. At present, the sol-gel synthesis of CCTO ceramics and films is becoming increasingly popular [16][17][18][19][20][21][22][23][24][25]. Elemental substitution which can often change the crystal structure and electronic structure is a common method in materials research, it may be used to assist with the understanding of the origin of giant dielectric constant observed in CCTO ceramics.…”
Section: Introductionmentioning
confidence: 99%
“…In 2004, Chung et al [2] reported the non-ohmic property of CCTO. In order to understand the multifunctional behavior of such system, different researches are being conducted [3][4][5][6][7][8][9][10][11][12][13]. Several models have been proposed to explain the dielectric response such as: IBLC model (Internal Barrier Layer Capacitor) [14][15][16], and the NBLC model (Nanosized Barrier Layer Capacitor) [12,17].…”
Section: Introductionmentioning
confidence: 99%
“…Intrinsic models, such as structurally frustrated relaxor ferroelectric behavior [7], Maxwell-Wagner relaxation based extrinsic models of Schottky barriers, such as contact-electrode depletion effect [9] and internal barrier layer capacitor model (IBLC) [4], and other extrinsic models such as slow trap charge repositioning model [8] have been proposed. Furthermore, in view of both non-ohmic property and giant dielectric behavior, the extrinsic models of Schottky barriers seem more promising to explain the performance of CCTO ceramics [3,5,[10][11][12][13][14].…”
Section: Introductionmentioning
confidence: 99%