1998
DOI: 10.1021/jp972394v
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Structure and Mechanism of Photooxidation of Self-assembled Monolayers of Alkylthiols on Silver Studied by XPS and Static SIMS

Abstract: XPS and static SIMS have been employed to characterize the structures and the photooxidation of self-assembled monolayers (SAMs) of alkylthiols on silver. Samples were prepared by immersing silver substrates in thiol solutions for a range of times from 30 min to 40 h, but no changes were observed in either the compositions of the monolayers determined by XPS or the static SIMS spectra. Static SIMS spectra exhibited a range of characteristic molecular species that facilitated quantification of changes in the SA… Show more

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Cited by 125 publications
(195 citation statements)
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“…Monitoring of chemical surface reactions in SAMs by means of S-SIMS was exploited by Hutt et al (1998) to study the photo-oxidation of alkyl thiols on silver. Mass spectra from photo-oxidised SAMs contained intense SO À signal intensity gradually decreased with increasing exposure time.…”
Section: Surface Tailoringmentioning
confidence: 99%
“…Monitoring of chemical surface reactions in SAMs by means of S-SIMS was exploited by Hutt et al (1998) to study the photo-oxidation of alkyl thiols on silver. Mass spectra from photo-oxidised SAMs contained intense SO À signal intensity gradually decreased with increasing exposure time.…”
Section: Surface Tailoringmentioning
confidence: 99%
“…In addition to the ordered and dilute arrangement, TATA-based SAM can be more conveniently prepared (8 min) and is more stable in air than the thiol-system (requiring 2 days for the self-assembly process with thiols easy to be oxidized [43]). These features are very attractive for high-yield fabrication of functional molecular electronic devices.…”
Section: Lettersmentioning
confidence: 99%
“…1). 41 Unlike the OAH bond in phenol which dominantly takes part in the photoreduction of the acetone to generate phenoxy radicals, the SAH bond cleavage accounted for almost 100%, when methanethiol was irradiated with the light k ! 220 nm.…”
Section: Notementioning
confidence: 99%