Structure and Optical Properties of SrTiO3 Thin Films Prepared by a Sol–Gel Technique

Bao, Dinghua; Yang, Heqing; Zhang, Liangying; Yao, Xi

doi:10.1002/(sici)1521-396x(199810)169:2<227::aid-pssa227>3.0.co;2-r

Cited by 30 publications

(17 citation statements)

References 20 publications

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“…Shown in Fig. The weak dependence of refractive index on the Sr content can be explained by taking into account the very close value of refractive index obtained for BaTiO 3 and SrTiO 3 films [21]. From Fig.…”

Section: Analysis Procedures Of Se Datasupporting

confidence: 56%

Spectroscopic Ellipsometry of BaxSr1?xTiO3 Thin Films Prepared by the Sol-Gel Method

Yang

Tian³

et al. 2002

phys. stat. sol. (a)

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Subject classification: 77.55.+f; 78.20.Ci; 81.20.Fw Stoichiometric Ba x Sr 1Àx TiO 3 (BST) thin films with various values of x were prepared on Si(100) substrates by the sol-gel method. The influence of Sr content on the structure and the optical properties was studied by X-ray diffraction (XRD) and spectroscopic ellipsometry (SE) in the UV-visible region. The measured SE spectra were analyzed with an appropriate procedure to accurately determine the thickness and the optical constants of thin films. It has been found that the optical constants of the BST films are functions of the film composition. The optical bandgap energy increases with the increasing of Sr content.

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Section: Analysis Procedures Of Se Datasupporting

confidence: 56%

Spectroscopic Ellipsometry of BaxSr1?xTiO3 Thin Films Prepared by the Sol-Gel Method

Yang

Tian³

et al. 2002

phys. stat. sol. (a)

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“…The enhancement in the refractive index is directly related to the optical packing density, crystallinity, electronic structure, oxygen vacancies, and A-site atoms [42]. The change in electronic structure, reduction in oxygen vacancies, and improvement in optical packing density was observed with increasing the OMP as compared to the pure KNN films [14].…”

Section: Linear and Nonlinear Optical Propertiesmentioning

confidence: 92%

Optical and dielectric studies on radio frequency sputtered Gd2O3 doped K0.5Na0.5NbO3 thin films for nonlinear photonic and microwave tunable device applications

Peddigari

Bharti

Khare

et al. 2016

Journal of Alloys and Compounds

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“…The authors explain these differences due to: a) the change in crystal structure [11], b) phase change [15], c) the increase in interatomic space due to excess volume and absence of long-range order in the lattice, in addition to the Burstein-Moss effect due to oxygen vacancies [14] d) the change in size of the microstructure [16], e) the presence of amorphous material and the effect of quantum size [25,26,28].…”

Section: Preprints (Wwwpreprintsorg) | Not Peer-reviewed | Postedmentioning

confidence: 99%

Set-Up Method on Properties of BaXSr1-XTiO3 Thin Films Deposited by RF-Magnetron Co-Sputtering by Projecting Temperature and Stoichiometric Effect

Estrada-Martínez¹,

Melo-Banda²,

Páramo-García³

et al. 2017

Preprint

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Thin films (100-400 nm) of BaxSr1-xTiO3 (0≤x≤1) deposited in RF-magnetron co-sputtering equipment are presented in this research work. The change of deposition rate, gap energy, and resistivity as a function of temperature-applied power change in the growth parameters was studied through the ISO colour-code lines constructed with MATLAB:By analysing the trend information and take into account the influence of the calculated "x" parameter with the Boltzmann profile fitting is proposed a method to allow a controlled set up of the RFmagnetron co-sputtering system and predict the Eg and resistivity values in the BaxSr1-xTiO3 solid solution with 0≤x≤1 for amorphous and crystalline phases. Also, a versatile tool to optimise the deposition process and material properties.keywords: BaxSr1-xTiO3 films; boltzmann modelling; optical band gap; deposition rate; stoichiometric content Preprints (www.preprints.org) | NOT PEER-REVIEWED | Posted:

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Structure and Optical Properties of SrTiO3 Thin Films Prepared by a Sol–Gel Technique

Cited by 30 publications

References 20 publications

Spectroscopic Ellipsometry of BaxSr1?xTiO3 Thin Films Prepared by the Sol-Gel Method

Spectroscopic Ellipsometry of BaxSr1?xTiO3 Thin Films Prepared by the Sol-Gel Method

Optical and dielectric studies on radio frequency sputtered Gd2O3 doped K0.5Na0.5NbO3 thin films for nonlinear photonic and microwave tunable device applications

Set-Up Method on Properties of Ba<sub>X</sub>Sr<sub>1-X</sub>TiO<sub>3</sub> Thin Films Deposited by RF-Magnetron Co-Sputtering by Projecting Temperature and Stoichiometric Effect

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