2012
DOI: 10.1038/srep00398
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Structure and Properties of Dense Silica Glass

Abstract: The O K-edge x-ray Raman scattering (XRS), Brillouin scattering and diffraction studies on silica glass at high pressure have been elucidated in a unified manner using model structures obtained from First-Principles molecular dynamics calculations. This study provides a comprehensive understanding on how the structure is related to the physical and electronic properties. The origin of the “two peak” pattern in the XRS is found to be the result of increased packing of oxygen near the Si and is not a specific si… Show more

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Cited by 89 publications
(90 citation statements)
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“…Such dV S / dP changes observed above~100 GPa have previously been interpreted to reflect the onset of the average Si-O coordination number changing from just 6 to 6 + (Murakami and Bass 2010, 2011). This conclusion subsequently found support in the results from MD computer simulations (Brazhkin et al 2011;Wu et al 2012). To determine the pressure conditions at which this abrupt change of dV S /dP occurs, we adopted the same criteria as Bass (2010, 2011).…”
Section: Resultsmentioning
confidence: 69%
“…Such dV S / dP changes observed above~100 GPa have previously been interpreted to reflect the onset of the average Si-O coordination number changing from just 6 to 6 + (Murakami and Bass 2010, 2011). This conclusion subsequently found support in the results from MD computer simulations (Brazhkin et al 2011;Wu et al 2012). To determine the pressure conditions at which this abrupt change of dV S /dP occurs, we adopted the same criteria as Bass (2010, 2011).…”
Section: Resultsmentioning
confidence: 69%
“…They are also known to be an excellent host matrix for rare earth oxides because of their good glass forming ability when compared to several other conventional systems such as borate, phosphate, germinate, vanadate and tellurite glass families. This makes it an interesting system for experimental and theoretical studies [8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…하지만 이전 연구에서 규산염 및 Mg-규산염 결정질 물질에 대하여 계산된 O원자 K-전자껍질 ELNES 스펙트럼이 XRS 실험결과를 재현하고 있 음을 확인하였기 때문에 본 연구에서 얻어진 결과 는 MgSiO 3 Pv의 전자구조를 반영하고 있을 것이 다 (Yi and Lee, 2010;Yi and Lee, 2012 Si-O- [6] Si 결합각( [6] Si-O1- [6] Si 결합각 3.54° 감 소; [6] Si-O2- [6] Si 결합각 4.41° 감소) 등의 국소 원 자구조에 뚜렷한 변화가 나타난다 (Table 1). (Lin et al, 2007;Fukui et al, 2009;Wu et al, 2012). …”
Section: 계산 방법unclassified
“…XRS 실험과 관련된 양자화학계산을 이용한 이전 연구에서는 X-선 Raman 산란 실험을 통하여 얻어 진 SiO 2 결정질 고압 동질이상 물질들의 Si 원자 L-전자껍질과 O 원자 K-전자껍질 XRS 스펙트럼 들의 특징적인 형태를 계산을 통하여 얻은 O 원자 의 p*-오비탈과 Si 원자의 s*-와 d*-오비탈의 국 소상태밀도(PDOS, partial density of states)를 통 하여 그 미시적인 기원을 설명하였다 (Fukui et al, 2009) (Yi and Lee, 2012). 그리 고 또 다른 연구에서는 양자화학계산을 통해 SiO 2 결정질 고압 동질이상 물질의 PDOS를 얻어 SiO 2 비정질 물질의 압력에 의한 O 원자 K-전자껍질 XRS 스펙트럼 변화의 기원이 되는 압력에 의한 원자구조의 변화를 해석하기 위하여 노력하였다 (Wu et al, 2012).…”
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