2007
DOI: 10.1134/s1027451007010065
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Structure and properties of ZnSe nanocomposite thin films

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Cited by 11 publications
(2 citation statements)
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“…3.). This shift may be related to the smaller atomic radius (1.09 Å) of the S atom than the atomic radius (1.22 Å) of the Se atom [24,25]. The interplaner spacing dhkl for these thin films were calculated from Bragg's law [26] 2 sin…”
Section: X-ray Diffraction Analysis Of Cdse1-xsx Thin Filmsmentioning
confidence: 99%
“…3.). This shift may be related to the smaller atomic radius (1.09 Å) of the S atom than the atomic radius (1.22 Å) of the Se atom [24,25]. The interplaner spacing dhkl for these thin films were calculated from Bragg's law [26] 2 sin…”
Section: X-ray Diffraction Analysis Of Cdse1-xsx Thin Filmsmentioning
confidence: 99%
“…Zinc selenide layer was deposited onto the surface of porous film at the temperature of 150 °C, by a thermal evaporation of bulk ZnSe in high (10 -5 Pa) vacuum [10]. For further analysis by the SEM, the sample was fixed on a carbon tape and the matrix was selectively dissolved in 5 % H 3 PO 4 .…”
Section: Experimental 21 Sample Preparationmentioning
confidence: 99%