2011
DOI: 10.1088/0953-8984/23/17/175003
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Structure and stability of nickel/nickel oxide core–shell nanoparticles

Abstract: The results of a combined x-ray photoelectron spectroscopy (XPS) and high resolution transmission electron microscopy (HR-TEM) study of Ni nanoparticles (NP), before and after oxidation, are presented. An experimental set-up was realized for the preparation and study of pre-formed NP films, concentrating the attention on Ni NP in the diameter range between 4 and 8 nm. The XPS data were taken in situ from NPs after different stages of oxidation, including controlled dosing of O(2) gas in the experimental system… Show more

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Cited by 48 publications
(71 citation statements)
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“…Aggregation of the NPs was also observed with scanning TEM-high angle annular dark field (STEM-HAADF) ( Figure 2a) and TEM (see also Supporting Information File 1). Areas with different crystal domains were observed and are evidently caused by crystal twinning, which occurs during the NP growth process [28] or by formation of NP agglomerates with different crystal orientations after deposition and diffusion on the substrate [29][30][31]. Figure 2b shows an atomic resolution TEM image of a single NP.…”
Section: Resultsmentioning
confidence: 99%
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“…Aggregation of the NPs was also observed with scanning TEM-high angle annular dark field (STEM-HAADF) ( Figure 2a) and TEM (see also Supporting Information File 1). Areas with different crystal domains were observed and are evidently caused by crystal twinning, which occurs during the NP growth process [28] or by formation of NP agglomerates with different crystal orientations after deposition and diffusion on the substrate [29][30][31]. Figure 2b shows an atomic resolution TEM image of a single NP.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 2b shows an atomic resolution TEM image of a single NP. The image corresponds to a McKay icosahedral geometry, where the icosahedron is assembled from single crystal tetrahedra with (111) faces [28,32] (see Figure 2c). This type of structure, as previously observed in other fcc metal NPs [22,23,28,33], can be ascribed to the dynamics of NP growth.…”
Section: Resultsmentioning
confidence: 99%
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“…Defect analysis was performed on cross-section specimens by TEM at 200 keV (STEM/TEM JEOL 2200 FS) operated in the two beam diraction contrast, high resolution (HR-TEM) and high angle annular dark eld (HAADF) modes. Strain maps to locate the dislocations at the interface were obtained by geometric phase analysis (GPA) [23,24] processing of HR-TEM images using the STEM--CELL software package [25,26]. The 110 cross-section specimens were prepared by sandwiching a piece of the sample between two slabs of Si, followed by mechanical grinding down to 30 µm.…”
Section: Methodsmentioning
confidence: 99%