“…Furthermore, rigorous and detailed characterizations of dopants and/or defects also are critical. Such characterization can be performed with X-ray diffraction (Wang et al, 2006), nano beam diffraction with high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) (Ward et al, 2014), slow positron beam spectroscopy (Xue et al, 2013), photo-luminescent (PL) emission (Sekiguchi et al, 2000;Zhang et al, 2014), X-ray absorption spectroscopy (XAS) (Brown and Parks, 2001;Rossi et al, 2014;Waychunas and Zhang, 2008), X-ray standing wave measurements , and X-ray spectromicroscopy (STXM) (Chen et al, 2014;Myneni et al, 1999;Warwick et al, 1998). Not only material scientists but also nanotxicologists can add these characterization tools to the routine assessment sequence, depending on the ROS-generation ability of the MONPs (predicted or characterized by the material scientists).…”