1996
DOI: 10.1002/pssa.2211550214
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Structure, Composition, Dielectric, and AC Conduction Studies on Tin Selenide Films

Abstract: Al‐SnSe‐Al thin film capacitors were fabricated onto well cleaned glass substrates by thermal evaporation under a pressure of 2 mPa. Multiple beam interferometry (MBI) was used to measure the thicknesses of the SnSe films. The composition and structure of SnxSe1‐x films were analysed using Rutherford backscattering spectrometry and X‐ray diffractogram, respectively. The capacitor samples were stabilised by aging and annealing. The variations of the dielectric constant and loss as a function of frequency at dif… Show more

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Cited by 43 publications
(14 citation statements)
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“…As a result, the carriers become trapped or replaced at the electrodes, resulting in space charge and macroscopic field distortion. This space charge layer should lead to a substantial increase in capacitance [12][13][14].…”
Section: 5mentioning
confidence: 99%
“…As a result, the carriers become trapped or replaced at the electrodes, resulting in space charge and macroscopic field distortion. This space charge layer should lead to a substantial increase in capacitance [12][13][14].…”
Section: 5mentioning
confidence: 99%
“…The electrical resistance of SnSe semiconducting single crystals is pressure dependent [7]. Preparation of SnSe thin films was reported from various experimental techniques [8][9][10][11][12][13]. Ana Cláudia Bernardes-Silva et al [14] have reported that the phase change of SnSe bulk material occurs due to annealing.…”
Section: Introductionmentioning
confidence: 99%
“…The structure of the deposited thin films strongly influences the electronic properties which are highly dependent on the preparation technique and deposition conditions. Considerable attention has been devoted by various authors to the preparation of SnSe thin films by different methods like vacuum evaporation [2][3][4][5][6][7][8][9][10][11][12], flash evaporation [13], hot wall epitaxy [14,15], reactive evaporation [16], electrodeposition [17][18][19][20], laser ablation [21,22], brush plating [23], chemical bath deposition (CBD) [24] and electrochemical atomic layer epitaxy (ECALE) [25] to study various physical properties.…”
Section: Introductionmentioning
confidence: 99%