2009
DOI: 10.1016/j.jmmm.2009.04.039
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Structure, magnetic and magnetostrictive properties of as-deposited Fe–Ga thin films

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Cited by 67 publications
(48 citation statements)
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References 33 publications
(42 reference statements)
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“…The positive E-ield was referred to be parallel to the prepolarization of the substrate, while the negative E-ield was referred to be antiparallel. The effective saturation magnetostriction constants (λ) were measured using a technique [25,26] based on the Villari effect. Because it is dificult to directly measure λ of the CoFe ilm on the PMN-PT substrate, it was estimated by measuring the same grown CoFe ilm on a Si substrate.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The positive E-ield was referred to be parallel to the prepolarization of the substrate, while the negative E-ield was referred to be antiparallel. The effective saturation magnetostriction constants (λ) were measured using a technique [25,26] based on the Villari effect. Because it is dificult to directly measure λ of the CoFe ilm on the PMN-PT substrate, it was estimated by measuring the same grown CoFe ilm on a Si substrate.…”
Section: Methodsmentioning
confidence: 99%
“…These H eff values were plotted as a function of the inverse band radii (1/R) and then the gradient of each line was determined. Finally, the λ was determined from [25,26] …”
Section: Methodsmentioning
confidence: 99%
“…Moreover, few works have been devoted to the investigation of Fe 1Àx Ga x thin films. [12][13][14][15][16] In a previous work, we studied the characteristics of Tb x Fe 1Àx thin films. 17 In this work, we analyze and correlate the structural and magnetic properties of as-grown and annealed [TbFe 2 /Fe 3 Ga] n heterostructures.…”
Section: Introductionmentioning
confidence: 99%
“…The H k was taken at the M/M s ¼ 1. The effective saturation magnetostriction constants (k) were measured using a technique 27 based on the Villari effect. Cross-sectional transmission electron microscopy (TEM) specimens were prepared by Focused Ion Beam (FIB) in FEI Quanta 200 3D and observed on both FEI Tecnai T20 and Jeol 2010F operating at 200 kV.…”
Section: Introductionmentioning
confidence: 99%