Structure of clean and H-saturated epitaxial two-dimensional Er silicide on Si(111) studied by SEXAFS

Tuilier, M.-H.; Pirri, C.; Berling, Dominique; Bolmont, D.; Gewinner, G.; Wetzel, P.

doi:10.1016/j.susc.2004.02.023

Cited by 4 publications

(3 citation statements)

References 24 publications

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“…This is of the same order of magnitude as in previous calculations for the YSi 2 silicide monolayer [24,29,54]. Interestingly, the orientation of the uppermost bilayer can be switched by H adsorption [57]. A monolayer geometry based on the rare earth adsorbed at the local fcc minimum (or H 3 position, see Fig.…”

Section: B the Resi 2 Monolayer With 1 × 1 Periodicitysupporting

confidence: 80%

“…The predicted distances for atomic layers labeled Si 1 to Si 4 in Fig. 4(a) are compiled in Table IV, together with experimental results for comparison [57]. The calculated data are in good agreement with the measured values obtained from surface extended x-ray absorption fine structure (SEXAFS) experiments.…”

Section: B the Resi 2 Monolayer With 1 × 1 Periodicitysupporting

confidence: 72%

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Rare-earth silicide thin films on the Si(111) surface

et al. 2016

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Rare-earth induced layered structures on the Si(111) surface are investigated by a combined approach consisting of ab initio thermodynamics, electron and x-ray diffraction experiments, angle-resolved photoelectron spectroscopy, and scanning tunneling microscopy. Our density functional theory calculations predict the occurrence of structures with different periodicity, depending on the rare-earth availability. Microscopic structural models are assigned to the different silicide phases on the basis of stability criteria. The thermodynamically stable theoretical models are then employed to interpret the experimental results. The agreement between the simulated and measured scanning tunneling microscopy images validates the proposed structural models. The electronic properties of the surfaces are discussed on the basis of the calculated electronic band structure and photoelectron spectroscopy data.

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Section: B the Resi 2 Monolayer With 1 × 1 Periodicitysupporting

confidence: 80%

Section: B the Resi 2 Monolayer With 1 × 1 Periodicitysupporting

confidence: 72%

Rare-earth silicide thin films on the Si(111) surface

et al. 2016

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“…have attracted considerable attention as model candidates for heteroepitaxial growth on Si(1 1 1) due to their low lattice mismatch with Si(1 1 1) [1][2][3][4][5][6][7][8]. Rare-earth metal induced reconstructions on silicon are critically dependent on coverage and annealing temperature.…”

Section: Introductionmentioning

confidence: 99%