2010
DOI: 10.1088/0953-8984/22/40/404205
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Structure of GeSe4–In and GeSe5–In glasses

Abstract: Abstract(Ge 0.2 Se 0.8 ) 100-x In x and (Ge 0.17 Se 0.83 ) 100-x In x (x = 0, 5, 10, 15 at.%) chalcogenide glasses have been studied with high-energy x-ray diffraction, neutron diffraction and extended x-ray absorption spectroscopy at Ge, Se and In K-edges. The experimental data were modelled simultaneously with the reverse Monte-Carlo simulation method. GeSe 4/2 tetrahedra are shown to be the main structural units in the binary and ternary glasses investigated. Indium bonds to the excess Se atoms in the terna… Show more

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Cited by 15 publications
(17 citation statements)
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“…Two amorphous chalcogenide systems with nominal compositions of GeSe4In10 and GeSe4In15 were studied; both systems were originally synthesized in [13] from elemental Ge, Se and In (all elements were of 99.99% purity), by sealing the required alloy constituents in quartz ampoules under an underpressure of 10 −3 Pa and heating the mixtures up to 1273 K under continuous vibration stirring, at a rate of 2 K/min. The samples were then quenched in a mixture of ice and water and total scattering datasets were obtained by X-Ray (XRD) and Extended X-Ray Absorption Fine Structure (EXAFS) spectroscopy.…”
Section: Methodsmentioning
confidence: 99%
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“…Two amorphous chalcogenide systems with nominal compositions of GeSe4In10 and GeSe4In15 were studied; both systems were originally synthesized in [13] from elemental Ge, Se and In (all elements were of 99.99% purity), by sealing the required alloy constituents in quartz ampoules under an underpressure of 10 −3 Pa and heating the mixtures up to 1273 K under continuous vibration stirring, at a rate of 2 K/min. The samples were then quenched in a mixture of ice and water and total scattering datasets were obtained by X-Ray (XRD) and Extended X-Ray Absorption Fine Structure (EXAFS) spectroscopy.…”
Section: Methodsmentioning
confidence: 99%
“…The XRD datasets were recorded by a Ge solid-state detector at the BW5 facility in HASYLAB, DESY at incident beam energy of 100 keV with a cross section equal to 4 mm 2 and appropriate corrections (background, absorption, polarization) were imposed on the resultant data. EXAFS transmission datasets (approximately 1/e) were attained with a step size of 0.5 eV in the vicinity of the absorption edge for Ge, Se and In K-edges at the HASYLAB X beamline [13]. The materials' total structure factors, S(Q), were estimated on the basis of the experimental X-ray and neutron scattering intensities attained; The total S(Q) data were then correlated to the partial structure factors, Sij(Q) via the Faber-Ziman formalism [14].…”
Section: Methodsmentioning
confidence: 99%
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