2022
DOI: 10.1002/pssb.202100513
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Structure of the Surface Region of Stainless Steel: Bulk and Thin Films

Abstract: The surface region of austenitic stainless steel (SS) is investigated by synchrotron X‐ray powder diffraction (XRPD) and X‐ray absorption near edge structure (XANES) measurements, because its composition and structure are crucial for the corrosion resistance of SS. Grazing incidence XRPD of a polished AISI 304 bulk steel sample shows that the near‐surface structure is modified. The concentration of the ferrite phase of Fe, a typical minority phase in AISI 304, increases gradually from 10% to 30% when approachi… Show more

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Cited by 7 publications
(2 citation statements)
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“…The origin of the corrosion resistance of stainless steels (SSs) has been extensively studied for many decades. It has been revealed that the surface of the SS is covered with a few nanometer (nm) thick oxides, which acts as a protection layer against further reaction into the inner region. For example, a recent study using X-ray absorption spectroscopy (XAS) combined with X-ray standing wave (XSW) , reported that a 2 nm thick passive surface layer consists of oxidized Fe and Cr. , Note that they did not observe the SS itself but used a 4 nm thick FeCrNi film with a metal composition close to that of SS304.…”
Section: Introductionmentioning
confidence: 99%
“…The origin of the corrosion resistance of stainless steels (SSs) has been extensively studied for many decades. It has been revealed that the surface of the SS is covered with a few nanometer (nm) thick oxides, which acts as a protection layer against further reaction into the inner region. For example, a recent study using X-ray absorption spectroscopy (XAS) combined with X-ray standing wave (XSW) , reported that a 2 nm thick passive surface layer consists of oxidized Fe and Cr. , Note that they did not observe the SS itself but used a 4 nm thick FeCrNi film with a metal composition close to that of SS304.…”
Section: Introductionmentioning
confidence: 99%
“…19,20 The use of large-scale facilities also makes it possible to characterize films under ambient pressure. 21 It is possible to combine both diffraction and X-ray adsorption techniques to perform in situ measurements on oxide film structure and chemistry, 22 but given the thickness of the film, it is difficult to resolve in-film gradients. As exemplified in the present study, high-kinetic energy sources are also available as laboratory instruments.…”
mentioning
confidence: 99%