Structured Illumination and Image Scanning Microscopy

doi:10.1002/9783527802074.ch4

Super‐Resolution Microscopy 2017

DOI: 10.1002/9783527802074.ch4

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Structured Illumination and Image Scanning Microscopy

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2021

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Recent advances in structured illumination microscopy

Wen

Liu

et al. 2021

J. Phys. Photonics

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Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented.

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Recent advances in structured illumination microscopy

Wen

Liu

et al. 2021

J. Phys. Photonics

View full text Add to dashboard Cite

show abstract

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Structured Illumination and Image Scanning Microscopy

Cited by 1 publication

References 76 publications

Recent advances in structured illumination microscopy

Recent advances in structured illumination microscopy

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