Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP) 2018
DOI: 10.1364/3d.2018.3m3g.3
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Structured Light Imaging under Sunlight Conditions

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“…Depth imaging techniques, such as structured light (SL) and time-of-flight (ToF), rely on infrared light pulses toward the object and the photodetection of the backscattered light (Figure a). Ambient illuminationin particular, sunlightcontributes to unwanted background current that degrades the accuracy and resolution of these techniques. Depth imaging techniques, such as SL, require that the projected pattern’s light intensity be comparable with that of the ambient light; yet sunlight is often 2–5 orders of magnitude brighter than the projected infrared light, making many depth imaging systems unsuitable for outdoor operation. These systems commonly rely on silicon (Si) photodetectors due to their highly scaled, low-cost production. As the bandgap of Si limits photodetection to wavelengths shorter than 1100 nm, depth imaging systems operate with 850–950 nm light sources. , …”
mentioning
confidence: 99%
“…Depth imaging techniques, such as structured light (SL) and time-of-flight (ToF), rely on infrared light pulses toward the object and the photodetection of the backscattered light (Figure a). Ambient illuminationin particular, sunlightcontributes to unwanted background current that degrades the accuracy and resolution of these techniques. Depth imaging techniques, such as SL, require that the projected pattern’s light intensity be comparable with that of the ambient light; yet sunlight is often 2–5 orders of magnitude brighter than the projected infrared light, making many depth imaging systems unsuitable for outdoor operation. These systems commonly rely on silicon (Si) photodetectors due to their highly scaled, low-cost production. As the bandgap of Si limits photodetection to wavelengths shorter than 1100 nm, depth imaging systems operate with 850–950 nm light sources. , …”
mentioning
confidence: 99%