Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging

Sandberg, Richard L.; Huang, Zhifeng; Xu, Rui; Rodríguez, José A.; Miao, Jianwei

doi:10.1007/s11837-013-0699-8

Cited by 9 publications

(3 citation statements)

References 161 publications

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“…However, limited access and experimental time hinder the development and applications of CDI using these methods. Thus, over the past several years, CDI microscopes that are based on tabletop sources of coherent extreme UV and soft X-rays are also being developed [113]. Figure 11 shows the first tabletop CDI experiment with extreme UV wavelength.…”

Section: Tabletop Short Wavelength CDImentioning

confidence: 99%

Phase Retrieval with Application to Optical Imaging: A contemporary overview

Shechtman

Eldar

Cohen

et al. 2015

IEEE Signal Process. Mag.

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1,032

793

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Section: Tabletop Short Wavelength CDImentioning

confidence: 99%

Phase Retrieval with Application to Optical Imaging: A contemporary overview

Shechtman

Eldar

Cohen

et al. 2015

IEEE Signal Process. Mag.

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1,032

793

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“…Coherent X-ray diffraction imaging (CXDI) is an imaging approach based on computationally reconstructing images of the object from far-field (Fraunhofer) diffraction patterns obtained with a highly coherent X-ray beam (Chapman & Nugent, 2010). The key advantage of CXDI is that 3D electron-density maps of the sample can be obtained with a high spatial resolution as good as 5 nm (Chapman & Nugent, 2010;Miao et al, 2015;Sandberg et al, 2013). CXDI does not require a vacuum environment, as is the case in electron microscopy, and hence reduces the challenges with the sample degradation.…”

Section: Introductionmentioning

confidence: 99%

Nanoscale imaging of shale fragments with coherent X-ray diffraction

Chattopadhyay¹,

Madathiparambil²,

Mürer³

et al. 2020

J Appl Cryst

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Despite the abundance of shales in the Earth's crust and their industrial and environmental importance, their microscale physical properties are poorly understood, owing to the presence of many structurally related mineral phases and a porous network structure spanning several length scales. Here, the use of coherent X-ray diffraction imaging (CXDI) to study the internal structure of microscopic shale fragments is demonstrated. Simultaneous wide-angle X-ray diffraction (WAXD) measurement facilitated the study of the mineralogy of the shale microparticles. It was possible to identify pyrite nanocrystals as inclusions in the quartz–clay matrix and the volume of closed unconnected pores was estimated. The combined CXDI–WAXD analysis enabled the establishment of a correlation between sample morphology and crystallite shape and size. The results highlight the potential of the combined CXDI–WAXD approach as an upcoming imaging modality for 3D nanoscale studies of shales and other geological formations via serial measurements of microscopic fragments.

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“…Laser driven high harmonic generation (HHG) sources allowed successful implementation of CDI at the lab scale 5 6 . However, typical HHG sources suffer from a low conversion efficiency and thus one either needs a large laser system for single-shot performance 7 8 9 or relatively long exposure times 10 11 12 13 , which again renders broad usage of this technology, e.g., high resolution imaging in life sciences, difficult.…”

mentioning

confidence: 99%

Real-time and Sub-wavelength Ultrafast Coherent Diffraction Imaging in the Extreme Ultraviolet

Zürch

Rothhardt

Hädrich

et al. 2014

Sci Rep

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Coherent Diffraction Imaging is a technique to study matter with nanometer-scale spatial resolution based on coherent illumination of the sample with hard X-ray, soft X-ray or extreme ultraviolet light delivered from synchrotrons or more recently X-ray Free-Electron Lasers. This robust technique simultaneously allows quantitative amplitude and phase contrast imaging. Laser-driven high harmonic generation XUV-sources allow table-top realizations. However, the low conversion efficiency of lab-based sources imposes either a large scale laser system or long exposure times, preventing many applications. Here we present a lensless imaging experiment combining a high numerical aperture (NA = 0.8) setup with a high average power fibre laser driven high harmonic source. The high flux and narrow-band harmonic line at 33.2 nm enables either sub-wavelength spatial resolution close to the Abbe limit (Δr = 0.8λ) for long exposure time, or sub-70 nm imaging in less than one second. The unprecedented high spatial resolution, compactness of the setup together with the real-time capability paves the way for a plethora of applications in fundamental and life sciences.

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Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging

Cited by 9 publications

References 161 publications

Phase Retrieval with Application to Optical Imaging: A contemporary overview

Phase Retrieval with Application to Optical Imaging: A contemporary overview

Nanoscale imaging of shale fragments with coherent X-ray diffraction

Real-time and Sub-wavelength Ultrafast Coherent Diffraction Imaging in the Extreme Ultraviolet

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