2014
DOI: 10.1109/ted.2014.2303981
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Studies of Safe Operating Area of InGaP/GaAs Heterojunction Bipolar Transistors

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Cited by 9 publications
(9 citation statements)
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“…3. The solid red dots are the failure points where the J c exhibits bent-over or snapback which is identical to the measurement [4, 7]. The boundary of SOA that is formed with these failure points demonstrates two distinct regions as experimentally shown in Fig.…”
Section: Resultssupporting
confidence: 75%
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“…3. The solid red dots are the failure points where the J c exhibits bent-over or snapback which is identical to the measurement [4, 7]. The boundary of SOA that is formed with these failure points demonstrates two distinct regions as experimentally shown in Fig.…”
Section: Resultssupporting
confidence: 75%
“…At low current and high voltage, however, the current usually bends up before it fails. The analytical modeling in [7] has successfully demonstrated the same phenomenon as observed experimentally. It shows that at low voltage and high current, the failure is controlled by the impact ionization because of the Kirk effect induced breakdown (KIB) (Kirk effect occurs when the mobile carrier density exceeds the space charge density in the collector causing the base push-out and electric field reversal [8]), and at low current and high voltage, the failure is governed by the self-heating effect.…”
Section: Introductionmentioning
confidence: 56%
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