The temperature dependence of the current-voltage (I-V) and capacitance-voltage (C-V) characteristics of an Au/n-type Si Schottky barrier diode (SBD) with a PEDOT:PSS interlayer was investigated. The SBD parameters, such as Schottky barrier height () B ), ideality factor (n), saturation current (I 0 ), doping concentration (N D ), and series resistance (R s ), were obtained as a function of temperature. The Richardson constant (A**) obtained from the In(I o /T 2 ) versus 1000/T plot was much less than the theoretical value for n-Si. The mean Schottky barrier height ( " È bo ) and standard deviation (· 0 ) calculated using the apparent Schottky barrier height () ap ) versus 1/2kT plot were 1.26 eV and 0.15 eV, respectively. From a fit of the modified Richardson plot of ln(I 0 /T 2