“…It is shown in Appendix A that the probability of a failure F, in a length L , having survived a proof stress U,,, is F, = I -exp (Lu,"(uj; -(s/t,,)''l'")) (4) where S = E ( u " t ) for all applied stresses U for time t experienced by the length L, including the prooftest, and the fatigue constant n is derived empirically. This result is equivalent to that of [21], but is here derived with minimal dependence on fatigue theory, making use instead of empirical data and the equivalence of the fatigue processes in the field and in the prooftest. It is worth noting similarities between this approach and that employed for many other components, particularly optoelectronic ones, used in long haul systems [23].…”