1985
DOI: 10.1088/0022-3727/18/10/019
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Studies on e-beam deposited transparent conductive films of In2O3:Sn at moderate substrate temperatures

Abstract: An electron beam evaporation method is used to prepare In2O3 films with and without Sn doping. It is shown that highly transparent and conducting films can be prepared at substrate temperature as low as 200 degrees C. The characteristic feature of such films is their high carrier density and high infrared reflectivity. The lowest resistivity is found to be 2.4*10-4 Omega cm with a carrier concentration of 8*1020 cm-3 and mobility of about 30 cm2 V-1 s-1 at the doping level of 4 mol.% SnO2. These polycrystallin… Show more

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Cited by 39 publications
(14 citation statements)
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“…The resistivity, which depends on carrier concentration and Hall mobility, decreases from $3 Â 10 À2 O-cm for undoped ZnO to $6 Â 10 À4 O-cm for 2 at% Al doping. The initial increase in carrier concentration results in a decrease in the resistivity as a result of donor electrons from the Al dopant [3,18,19], and associated oxygen vacancies. However, with further increase in Al doping the resistivity starts increasing significantly.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…The resistivity, which depends on carrier concentration and Hall mobility, decreases from $3 Â 10 À2 O-cm for undoped ZnO to $6 Â 10 À4 O-cm for 2 at% Al doping. The initial increase in carrier concentration results in a decrease in the resistivity as a result of donor electrons from the Al dopant [3,18,19], and associated oxygen vacancies. However, with further increase in Al doping the resistivity starts increasing significantly.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…33 Also, transparency is unfortunately not perfect due to diffuse scattering from surface roughness and internal scattering from grain boundary effects. 33 There are several known methods to deposit thin films of ITO, including radio frequency (rf) sputtering, 34 magnetron sputtering, 35 dc field sputtering, 36 screen-printing technique, 37 electron 38 or ion 39 beam deposition, chemical vapor deposition, 40 activated reactive evaporation, 41 and spray pyrolysis. 42 We have chosen, herein, to use radio frequency sputtering.…”
mentioning
confidence: 99%
“…There are several known methods to deposit thin films of ITO, including radio frequency (rf) sputtering, magnetron sputtering, dc field sputtering, screen-printing technique, electron or ion beam deposition, chemical vapor deposition, activated reactive evaporation, and spray pyrolysis . We have chosen, herein, to use radio frequency sputtering.…”
mentioning
confidence: 99%
“…5(a). The remaining scattering contribution, due to ionized impurities, implies a linear dependence of l on T 3=2 at low temperature, 32 clearly observed in Fig. 5(b) at high carrier concentrations (>10 14 cm À2 ).…”
Section: A Space Charge Doping Of the Samplesmentioning
confidence: 62%