Study a scanning beam current in focusing ion beam device of overcome mirror effect

Zoory, Muayyed Jabar; Abid, Musatfa Mohaisen

doi:10.1016/j.ijleo.2018.01.051

Search citation statements

Order By: Relevance

Paper Sections

Select...

Introduction (12 Bold)1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2020

2022

Publication Types

Select...

Article3

Other1

Relationship

Self Cite0

Independent4

Authors

Journals

Cited by 4 publications

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…the ionic mirror effect [7,8]. In (FIB) microscope this phenomenon has been observed by Croccolo [9], later by the researcher Muayyed Jabar Zoory [8,[10][11][12][13].…”

Section: Introduction (12 Bold)mentioning

confidence: 99%

Determination of the Trapped Charge Using Scattering Method

2021

MJPS

View full text Add to dashboard Cite

The proposed scattering model can be used to express the total charge implanted in an insulator for Polyethylene terephthalate (PET). Using experimentally determined quantities in the ion mirror image method (IMIM) inside a focused ion beam (FIB) microscope. The scattering model establishes a physical foundation for IMIM charge determination. After theoretically obtaining the trapped charge values, using MATLAB simulationand compared it with the practically trapped charge value of the polyethylene terephthalate material to check if there is a match between the both results.

show abstract

“…the ionic mirror effect [7,8]. In (FIB) microscope this phenomenon has been observed by Croccolo [9], later by the researcher Muayyed Jabar Zoory [8,[10][11][12][13].…”

Section: Introduction (12 Bold)mentioning

confidence: 99%