1996
DOI: 10.1107/s010876739608097x
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Study of Al–C multilayers using anomalous reflectivity and high quantum wells using resolution diffraction studies of multilayers

Abstract: Polarized neutron reflectivity with polarization analysis enables one to determine in-plane vectorial magnetic depth profiles.We investigated the modifications of the magnetostrictive properties of nickel and nickel-iron thin films due to relaxation strains at the substrate/film and film/vacuum interfaces. The inplane magnetization rotation induced by a mechanical applied strain is shown to be non homogeneous throughout the layer. For a 100 nm iron-nickel thin film, the magnetization varies from 50° at the vac… Show more

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