2014
DOI: 10.1016/j.orgel.2013.12.008
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Study of effect of inserted pentacene layer in ITO/P(VDF-TrFE)/α-NPD/Au capacitor using electric-field-induced optical second-harmonic generation and displacement current

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Cited by 5 publications
(6 citation statements)
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“…The typical results from the DCM experiment can be found in Figure a, where two current peaks can be clearly observed from the I – V curve. (The voltage amplitude V m is 40 V.) As can be seen in Equation , the current peak in Figure a was caused by the switching (turn‐over) of the dipole moment in P(VDF‐TrFE) . In Figure a, two peaks were generated at 15.8 V in the process 0 → V m and at −15.8 V in the process 0 → − V m .…”
Section: Resultsmentioning
confidence: 90%
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“…The typical results from the DCM experiment can be found in Figure a, where two current peaks can be clearly observed from the I – V curve. (The voltage amplitude V m is 40 V.) As can be seen in Equation , the current peak in Figure a was caused by the switching (turn‐over) of the dipole moment in P(VDF‐TrFE) . In Figure a, two peaks were generated at 15.8 V in the process 0 → V m and at −15.8 V in the process 0 → − V m .…”
Section: Resultsmentioning
confidence: 90%
“…The dipolar turn‐over occurred when the electric field across the P(VDF‐TrFE) layer reached the coercive field E c = 0.4 MV cm −1 . Briefly, the DCM in our case can be given as I= (CVt+Pt)S…”
Section: Resultsmentioning
confidence: 97%
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“…These studies are mainly carried out by means of electrical measurements such as displacement current measurement (DCM) using ramp voltage [150,151], but these are no longer sufficient to account for carrier behaviors in a variety of organic semiconductor devices being utilized with ferroelectric P(VDF-TrFE) layers. Using EFISHG probes the electric field change induced in organic devices with a ferro-electric layer gives much information on the carrier behavior in these devices [152][153][154]. Figure 16 shows a typical example of DCM measurements for MFM and MFSM (the inset of Fig.…”
Section: A Double Layer El Diodesmentioning
confidence: 99%
“…We therefore have been developing a method of electric-field-induced optical second-harmonic generation (EFISHG) measurement that can probe carrier behavior in a selected layer of organic multilayer systems [6,23]. In our previous study, by combining the DCM with EFISHG measurement we discussed the interaction of interfacial charges and ferroelectric polarization in MFS diodes [24][25][26]. Results showed that accumulated charges at the interface make a significant contribution to the polarization reversal of the ferroelectric layer, and the presence of different polarization reversal processes was found, depending on experimental procedures, e.g., under illumination and in dark [27].…”
Section: Introductionmentioning
confidence: 99%