2010
DOI: 10.1007/s10948-010-0740-x
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Study of Fe3O4 Nano-Magnetic Ferrofluid by Atomic Force Microscope

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Cited by 8 publications
(3 citation statements)
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“…[22] The applied field, which can change (150 150 nm 2 ). Reproduced with permission from reference [307]. Copyright 2010 Springer.…”
Section: Technological Applicationsmentioning
confidence: 99%
See 1 more Smart Citation
“…[22] The applied field, which can change (150 150 nm 2 ). Reproduced with permission from reference [307]. Copyright 2010 Springer.…”
Section: Technological Applicationsmentioning
confidence: 99%
“…[306b] The microstructure characterization of FFs using the atomic force microscopy (AFM) technique is also reported (Figure 23). [307] Here, the nano-FF has been made into thin-film samples before extracting information about the particle size and morphology. The technique of optical microscopy, because of the resolution limit, is not successful for observing FF grains as mentioned before.…”
Section: Characterization Techniquesmentioning
confidence: 99%
“…The piezoelectric cantilever is used in scanning probe microscopy (SPM), which not only can detect small forces, but also can detect such as temperature, field strength, mass, density and viscosity and other physical quantities, expanding the SPM's applications. [1][2][3][4] Piezoelectric microcantilever device has the excellent piezoelectric material, besides its ingenious microstructure size is the important guarantee of the nanometer resolution capability. [5][6][7][8] In this paper, a microcantilever device is designed for the IPC-208B type SPM, and we analyze the structure size's effect on the piezoelectric cantilever device, to provide the basis for improving the device performance.…”
Section: Introductionmentioning
confidence: 99%