Study of isotopic silver dissolution in vitreous GeSex thin films from secondary ion mass spectrometry measurements

In Situ Measurements of X‐Ray‐Induced Silver Diffusion into a Ge30Se70 Thin Film

“…Different experimental methods including Raman spectroscopy, 4 Rutherford spectroscopy, 4–7 electrical resistance measurements, 8 secondary ion mass spectroscopy, 9 modulated temperature scanning calorimetry, 10 Moessbauer spectroscopy, 9 X‐ray diffraction, 3,11 electron diffraction, 12 optical spectroscopy, 11 ellipsometry, 13 grazing‐incidence X‐ray scattering, 6 differential anomalous scattering, 6 extended X‐ray absorption fine structure (EXAFS), 6,8 transmission electron microscopy, 14 microlithography technique 7 , atomic force microscopy, and electron energy‐loss spectroscopy 16 have been used to obtain structural information connected with photodoping. In spite of this remarkable list of available data, the mechanism of electronic and structural transformations accompanying the photodiffusion of Ag into the Ge x Se 1−x matrix remains unclear.…”