2007
DOI: 10.1134/s106378260710003x
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Study of photoluminescence spectra of GaMnAs produced by low-temperature molecular beam epitaxy

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Cited by 4 publications
(5 citation statements)
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“…For GMn sample the temperature dependence of E x is weaker than in the control GaAs. As was demonstrated in our previous study [16], the difference becomes more significant with the increase in Mn concentration for homogeneous GaMnAs. The dependence of DE x on Mn Ga concentration is also supported by the fact that precipitation of Mn acceptors into MnAs clusters, caused by high temperature annealing, reduces the difference between the temperature dependences of E x values in GaMnAs and GaAs [13].…”
Section: Resultsmentioning
confidence: 62%
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“…For GMn sample the temperature dependence of E x is weaker than in the control GaAs. As was demonstrated in our previous study [16], the difference becomes more significant with the increase in Mn concentration for homogeneous GaMnAs. The dependence of DE x on Mn Ga concentration is also supported by the fact that precipitation of Mn acceptors into MnAs clusters, caused by high temperature annealing, reduces the difference between the temperature dependences of E x values in GaMnAs and GaAs [13].…”
Section: Resultsmentioning
confidence: 62%
“…(In fact, the hole concentration is lower than the Be acceptor concentration due to the compensation by donor-like defects, the concentration of which in GaAs-based materials grown by LT MBE is about 10 20 /cc [22]). As shown in our previous study, the doping GaAs with similar concentration of Mn notably modified the temperature dependence of DE x [13,16]. Hence, we can make a conclusion that doping GaAs with Be almost does not affect the temperature dependence of the band gap.…”
Section: Resultsmentioning
confidence: 77%
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“…These centers could, for example, play gallium atoms in the arsenic sub-lattice (so called EL2 centers) [14][15][16], which was generated in GaAs LT MBE process with a concentration of up to 10 20 cm À3 [17] or more complicated defect complexes such as arsenic anti-site complex [18]. The presence of a high concentration of Ga anti-sites in GaMnAs layers grown via LT MBE was directly confirmed by photoluminescence [19] and quasi-forbidden X-ray reflections measurements [20]. The domination of the contribution related with deep-level ionization into the PC phenomenon in the GaMnAs also explains the dependence of DR value on the T s .…”
Section: Resultsmentioning
confidence: 72%