Study of potential induced degradation mechanism in commercial PV module

Liu, Han-Chang; Huang, Chung-Teng; Lee, Wen‐Kuei

doi:10.1109/pvsc.2012.6318089

Cited by 2 publications

(2 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…More precise, the degradation is larger in the centre of the active part of the cell (between the bus bar and the edge of the cell). According to the results by Liu [17], the cell degradation occurs due to the migration of Na + ions. In total, the power output of positive biased modules was reduced by around 15 %, while the EL intensity was reduced for almost 50 % ( Table 2).…”

Section: Power Output and Electroluminescencementioning

confidence: 99%

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

Brecl

Bokalič

Topič

2017

Journal of Solar Energy Engineering

View full text Add to dashboard Cite

The photovoltaic (PV) modules are in PV arrays normally connected in series and thus some of them exposed to high system voltages since frames of the PV modules are grounded. To predict the long-term PV system energy output and PV module lifetime, it is very important to understand and take into account the degradation process of PV modules under high voltage stress. Accelerated tests under damp heat (over 1300 hours of DH85/60; RH = 85 %, T = 60 °C) of in-house developed monocrystalline silicon PV modules were preformed while connected to a positive or negative voltage bias of 1000 V. The negative biased modules exhibited just a little degradation, while the positive biased modules degraded rapidly. We identified three degradation mechanisms: ion migration, silver corrosion and EVA evaporation. The degradation mechanisms contribute to almost 15 % of the performance loss of the 1000 V positive biased modules after more than 1300 h of DH85/60 testing, while the power degradation of the negative biased modules remains below 3 %.

show abstract

Section: Power Output and Electroluminescencementioning

confidence: 99%

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

Brecl

Bokalič

Topič

2017

Journal of Solar Energy Engineering

View full text Add to dashboard Cite

show abstract

“…M. Schütze et al show that PID can also be caused by other ions usually not present in photovoltaic modules indicating that the chemical nature of the ions is not relevant for PID [7]. The Dr. Liu et al in their study directly verified that the PID caused by Na + from their saline water bath experiment [8]. Until now, there is no agreement with evidence that observed metal concentration increasing in the vicinity or inside the cell is responsible for shunting of PID affected modules.…”

Section: Introductionmentioning

confidence: 99%

High Voltage Stress Impact on P Type Crystalline Silicon PV Module

Liu¹,

Huang²,

Lee³

et al. 2013

EPE

Self Cite

View full text Add to dashboard Cite

The effects of the high voltage stress and other environmental conditions on crystalline silicon photovoltaic module performance have not been included in the IEC 61215 or other qualification standards. In this work, we are to evaluate the potential induced degradation on p type crystalline silicon PV modules by three cases, one case is in room temperature, 100% relative humidity water bath, another is in room temperature, the front sheet coverage with aluminum foil and the other is in the 85°C, 85% relative humidity climate chamber. All the samples are applied with the -1000 V bias to active layers, respectively. Our current-voltage measurements and electroluminescence results showed in these modules power loss of 37.74%, 11.29% and 49.62%, respectively. These test results have shown that among high voltage effects the climate chamber is the harshest and fastest test. In this article we also showed that the ethylene vinyl acetate volume resistivity and soda-lime glass ingredients are important factors to PID failure. The high volume resistivity which is more than 10¹⁴ Ω·cm and Na less contents glass will mitigate the PID effect to ensure PID free.

show abstract

Study of potential induced degradation mechanism in commercial PV module

Cited by 2 publications

References 4 publications

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

High Voltage Stress Impact on P Type Crystalline Silicon PV Module

Contact Info

Product

Resources

About