Study of the fabrication of infrared-transparent dielectric aspheric deposits by continuous-wave laser deposition

Design considerations for tailoring the thickness profile of transparent dielectric deposits by continuous-wave laser deposition

“…1,2 Alternatively, the use of laser deposition techniques for the fabrication of refractive optical elements by tailoring the thickness profile of dielectric deposits onto transparent substrates is being explored as a promising procedure for both reducing fabrication costs and designing complex optical elements (including freeform and hybrids). [4][5][6] In the course of the present research, results have been reported by the authors for the fabrication of axicon-like lenses made from infrared (IR) transparent amorphous semiconducting targets using a cw laser source. 5,6 Information about the optical performance of these axicon-like lenses, as well as the analysis of the light propagation in terms of the stationary-phase approximation, can be found in Refs.…”

“…[4][5][6] In the course of the present research, results have been reported by the authors for the fabrication of axicon-like lenses made from infrared (IR) transparent amorphous semiconducting targets using a cw laser source. 5,6 Information about the optical performance of these axicon-like lenses, as well as the analysis of the light propagation in terms of the stationary-phase approximation, can be found in Refs. 4-6. The analysis of the deposit thickness profiles was performed in a previous work 6 from the fitting of an analytical function corresponding to an evaporation point-source to the thickness records measured by a stylus-based profilometer.…”

“…5,6 Information about the optical performance of these axicon-like lenses, as well as the analysis of the light propagation in terms of the stationary-phase approximation, can be found in Refs. 4-6. The analysis of the deposit thickness profiles was performed in a previous work 6 from the fitting of an analytical function corresponding to an evaporation point-source to the thickness records measured by a stylus-based profilometer. Such a simplification was found to be relevant for the aims of testing the reproducibility of the deposition process and the distinct influence of intensity and time which follows a non-reciprocity law, depending on the laser power used.…”