2016
DOI: 10.5935/1984-2295.20160146
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Study of the optical phenomena in zircon with a Scanning Electron Microscope (SEM), using cathodoluminescence method and secondary electrons

Abstract: A B S T R A C TThe objective of this study is to analyze, describe and characterize, images in SEM (Scanning Electron Microscopy) and how a zircon sample ZR 008 (CRL05) behaves, in order to determine the possible locations where the laser ablation will be made (Ar/F). This procedure will be done to assist in the geological dating process, using the method by ICP / MS. Cathodluminescence and secondary electrons method were used in the process.

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