Study of the optical phenomena in zircon with a Scanning Electron Microscope (SEM), using cathodoluminescence method and secondary electrons.

Abstract

The objective of this study is to analyze, describe and characterize, images in SEM (Scanning Electron Microscopy) and how a zircon sample ZR 008 (CRL05) behaves, in order to determine the possible locations where the laser ablation will be made (Ar/F). This procedure will be done to assist in the geological dating process, using the method by ICP / MS. Cathodluminescence and secondary electrons method were used in the process.