2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3m-Nano) 2023
DOI: 10.1109/3m-nano58613.2023.10305324
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Study of the Sensitivity of MAPbI3 Radiation Detectors Based on Monte Carlo Simulation

Feng Qin,
Rui Zhao,
Weifeng Zhu
et al.
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