Study of VCO Delay Cell Topologies in a 3-stage DR-VCO for Radiation Hardening

Karthigeyan, K.A.; Chandramani, Premanand Venkatesh

doi:10.1109/radecs45761.2018.9328651

Cited by 3 publications

(3 citation statements)

References 5 publications

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“…Previous research results have proved that the charge pump (CP) and the voltage-controlled oscillator are sensitive modules of the PLL system, which are easily influenced by high-energy particles [8]. Therefore, using the radiation-hardened-by-design (RHBD) technology to reinforce the CP and voltage-controlled oscillator (VCO) can reduce the sensitivity of the PLL to the singleevent effect [9,10]. The author has put forward an effective radiation hardening scheme for the CP in the previous work [11], and this work focuses on the radiation hardening design of the VCO module.…”

Section: Introductionmentioning

confidence: 99%

A Single-Event-Hardened Scheme for Ring Oscillator Applied to Radiation-Resistant PLL Microsystems

2023

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A voltage-controlled oscillator (VCO) is one of the key modules of the phase-locked loop (PLL) microsystem, and it is easy to bombard using high-energy particles in a radiation environment, resulting in the single-event effect. In order to improve the anti-radiation ability of the PLL microsystems used in the aerospace environment, a new voltage-controlled oscillator hardened circuit is proposed in this work. The circuit consists of delay cells with an unbiased differential series voltage switch logic structure with a tail current transistor. By reducing sensitive nodes and using the positive feedback of the loop, the recovery process of the VCO circuit to the single-event transient (SET) is reduced and accelerated, so as to reduce the sensitivity of the circuit to the single-event effect. The simulation results based on the SMIC 130 nm complementary metal–oxide–semiconductor (CMOS) process show that the maximum phase shift difference of the PLL with the hardened VCO is reduced by 53.5%, which shows that the hardened VCO structure can reduce the sensitivity of the PLL to the SET and improve the reliability of the PLL in the radiation environment.

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Section: Introductionmentioning

confidence: 99%

A Single-Event-Hardened Scheme for Ring Oscillator Applied to Radiation-Resistant PLL Microsystems

2023

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“…This phase displacement causes interference in transceivers and data loss in communication links. Several studies have focussed on the hardening of the VCOs for radiation environments [5][6][7][8][9][10][11][12]. The Triple modular redundancy (TMR) technique is a widely adopted approach to prevent SEEs in PLL circuits [5,6].…”

Section: Introductionmentioning

confidence: 99%

“…Mitigating harmonic errors induced by the SET in a single ended inverter ring-based oscillator was proposed in [9]. Similarly, the SET effect on differential ring VCOs were studied in [10][11][12]. A new SET-H CDC delay cell for the DRVCO was proposed to reduce the SET sensitivity in [12].…”

Section: Introductionmentioning

confidence: 99%

Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Karthigeyan¹,

Radha²,

Manikandan

2021

IET Circuits, Devices & Syst

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Single-event transients (SETs) due to heavy-ion (HI) strikes adversely affect the electronic circuits in the sub-100 nm regime in the radiation environment. This study proposes techniques to mitigate SETs in CMOS voltage-controlled oscillators (VCOs) without affecting the circuit specifications. A circuit asymmetry technique is used for faster recovery of the oscillator in the event of a single event transient (SET) caused by an ion hit. Also, a new SET tolerant inductor capacitor-voltage controlled oscillator (LC-VCO) topology is proposed for a radiation environment that shows reduced phase displacement, amplitude displacement, and recovery time. A comparison has been made with various LC-VCOs that have an inherent rad-hard capability which proves a significant improvement in SET sensitivity. K E Y W O R D S radiation hardening (electronics), voltage-controlled oscillatorsThis is an open access article under the terms of the Creative Commons Attribution-NonCommercial License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited and is not used for commercial purposes.

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Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL

Karthigeyan¹,

Radha²

2020

International Journal of Electronics

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Study of VCO Delay Cell Topologies in a 3-stage DR-VCO for Radiation Hardening

Cited by 3 publications

References 5 publications

A Single-Event-Hardened Scheme for Ring Oscillator Applied to Radiation-Resistant PLL Microsystems

A Single-Event-Hardened Scheme for Ring Oscillator Applied to Radiation-Resistant PLL Microsystems

Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL

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