Study on a New Test and Diagnosis Method for Complex Integrated Circuit

Abstract

Due to the problem that test signals is difficult to describe and analyze in the microprocessor (CPU) and digital signal processor (DSP) circuit, this paper come up with a matrix base method to describe program signal and instruction signal, thus in theory solve the above problem. In the proposed method, simple hardware circuits can be used to produce different test signal needed in the test and diagnose of CPU circuit.