Study on Deterioration Mechanism of XLPE Cables

Kaminaga, K.; Yoshifuji, N.; Uozumi, T.; Yorita, Jun; Inoue, Y.; Fukunaga, S.

doi:10.1541/ieejfms1990.117.1_35

Cited by 10 publications

(7 citation statements)

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“…In particular the increase of deep donor traps will increase the EL through an increase of the recombination rates in equation (19). In addition the carrier mobility expressed through the parameters C e and C h will increase.…”

Section: Aging Effectmentioning

confidence: 99%

“…One consequence of this situation is that the sites that are connected form effective conducting paths for the injected charge rather than act as shallow traps. Because these paths avoid the deep traps the probability of EL emission by the recombination processes represented by equation (19) will cease to occur for carriers on the percolation cluster. The only contribution to EL via recombination processes will come from the recombination of electrons in the conduction state outside of the percolation cluster with deep-trapped holes.…”

Section: Qualitative Explanation For El Transition To Type B Emissionmentioning

confidence: 99%

“…In section 2.2.6 we assumed that all carriers could contribute to electroluminescence via recombination, with the resulting EL intensity given by Lu(r,t) in equation (19). Once percolation clusters begin to be formed however, this is no longer the case.…”

Section: Recombination Contribution To Type-b Elmentioning

confidence: 99%

“…where Lu(r,t) is given by equation (19). The rate of reduction in the density of deep trapped charge outside of the percolation cluster and new trap generation are still given by the equivalent to equations (14) to (17) and (26) and (27), with the appropriate probability ([1-P(r,t)]) for the mobile charge not being part of the percolation cluster.…”

Section: Recombination Contribution To Type-b Elmentioning

confidence: 99%

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Model for electrical tree initiation in epoxy resin

Dissado

2005

IEEE Trans. Dielect. Electr. Insul.

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A model for electrical tree initiation in epoxy resins is presented in which the process is driven by the generation of new charge traps as a result of energy transferred to the polymer via charge recombination processes. The electroluminescence intensity expected from the model is computed and shown to be in agreement with the experimental data. In particular it is shown how the initial emission due to recombination can change to an emission arising from impact excitation in a natural way when the trap density reaches a level sufficient for the high electric field of the tree initiation region to connect shallow traps to form conducting filamentary paths in the form of percolation clusters. This result allows the electroluminescence behavior to be correlated with the observed onset of filamentary damage. The model is also shown to be able to explain the decrease in emission intensity observed at the time of transition between the two mechanisms for luminescence. England twice he settled in at ChelseaCollege in 1977 to carry out research into dielectrics. His interest in breakdown and associated topics started with a consultancy with STL in 1981. Since then he has published many papers and one book, together with John Fothergill, in this area. In 1995 he moved to The University of Leicester, and was promoted to Professor in 1998. He has been a Visiting Professor at The University Pierre and Marie Curie in Paris, Paul Sabatier University in Toulouse, and Nagoya University, and has given numerous invited lectures, the most recent of which was the Whitehead lecture at IEEE CEIDP 2002 in Cancun, Mexico. Currently he is an Associate Editor of IEEE Transactions DEI, co-chair of the Multifactor Aging Committee of DEIS and a member of DEIS Administrative Committee.

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Section: Aging Effectmentioning

confidence: 99%

Section: Qualitative Explanation For El Transition To Type B Emissionmentioning

confidence: 99%

Section: Recombination Contribution To Type-b Elmentioning

confidence: 99%

Section: Recombination Contribution To Type-b Elmentioning

confidence: 99%

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Model for electrical tree initiation in epoxy resin

Dissado

2005

IEEE Trans. Dielect. Electr. Insul.

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“…These results imply that it is quite possible that both BF 3 and CdZnTe counters register the same phenomenon at the same time, namely, γ-rays (or X-rays). In addition to partial discharges taking place during the generation and progress of electric trees, luminous phenomenon is observed at the precursor stage of the tree formation (the peak is in the visible part of the optical spectrum and during a partial discharge the peak is in the ultraviolet part of the spectrum) [13]. The reason why no similar phenomena were reported with respect to water trees can be explained by the fact that the formation and propagation of water trees take place in weaker electric fields and no such phenomena as the charge injection, acceleration, recombination, etc.…”

Section: Radiation Count Rates and Energy Spectramentioning

confidence: 99%

Detection of weak radiation involving generation and progress of water tree

Kumazawa

Taniguchi

2008

Electrical Engineering Japan

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SUMMARYIt is well known that generation and progress of water trees in XLPE cables are strongly enhanced by inorganic impurities. We have investigated the effect of such impurities in the water treeing process and reported the experimental results as follows: (1) the anomalous increase or decrease in several kinds of inorganic elements was observed in water treed XLPE samples, (2) a distinctive relationship was found for the mass numbers for the elements, and (3) the isotopic content of the elements such as Zn deviated over 6% from the naturally occurring level. These results suggest that some unknown phenomena play a role in the formation of water trees, such as cold fusion or nuclear transmutation in condensed matter. In order to study the relationship between water trees and these phenomena, we attempted to detect neutrons, γ-rays, or X-rays accompanying the generation and progress of water trees in XLPE samples. In the experiments, weak and burst-like radiation, apparently low-energy γ-rays or X-rays, was often detected by BF 3 and/or CdZnTe counter. The radiation tended to be detected in the samples with a large number of water trees generated by supplying sufficient amounts of inorganic cations.

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The improved voltage life characteristics of EHV XLPE cables

Fukui

Hirotsu

Uozumi

1999

IEEE Trans. Power Delivery

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Although many researchers have investigated voltage life characteristics of XLPE cables, the voltage life curve of XLPE insulation has not been made clear because of large deviations in the obtained data. Moreover, the voltage life curve of a XLPE cable, which is significantly affected by defect size and shape, can not be applied to another cable having different defects. The authors obtained an intrinsic stress life curve of XLPE which included no defects. The intrinsic stress life curve demonstrates the existence of a threshold stress, which causes no degradation in the insulation. The application of the intrinsic stress life curve makes possible to estimate the voltage life curve of any cable with known defects. A method for calculating the defect size that would not initiate any degradation in XLPE insulation under a given electrical stress is proposed.

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Study on Deterioration Mechanism of XLPE Cables

Cited by 10 publications

References 0 publications

Model for electrical tree initiation in epoxy resin

Model for electrical tree initiation in epoxy resin

Detection of weak radiation involving generation and progress of water tree

The improved voltage life characteristics of EHV XLPE cables

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