Study on Influencing Factors of Adhesion Force on Disk Surface

Abstract

In this study, atomic force microscope (AFM) is used to study the friction characteristic between the probe and the disk. Some factors which affect the friction force such as the load and the scanning speed have been investigated, thus microscopic friction behavior of the head pole tip and disk could be obtained. Finally, the output voltage is used to characterize the friction. The results show that the relationship between normal force and friction is linear, and the faster scanning speed brings in the bigger friction.