2014 15th International Conference on Electronic Packaging Technology 2014
DOI: 10.1109/icept.2014.6922672
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Study on local recrystallization and damage mode of Lead-free BGA solder joint

Abstract: The compact and high-performance Lead-free BGA device has become the modern highly integrated device which is required in electronics assembly. In the course of service, they experience thermal cycling and become invalid. The failure mode of BGA device, which has undergone the thermal cycling, is investigated by scanning electronic microscope, electron back scattered diffraction and micro Vickers hardness tester. It concludes that the mismatch of the coefficient of thermal expansion between materials provides … Show more

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“…The created dislocations during indentation are therefore likely to be blocked by these IMCs and a higher hardness is obtained. This observation is also consistent with the study conducted by Arfaei et al, Chen et al and Xu et al on SAC305 solder joints [6,22,23]. It is also noteworthy that the SAC305 macrograins hardness does not exhibit large differences according to the crystallographic orientation.…”
Section: Nanoindentation Testssupporting
confidence: 92%
“…The created dislocations during indentation are therefore likely to be blocked by these IMCs and a higher hardness is obtained. This observation is also consistent with the study conducted by Arfaei et al, Chen et al and Xu et al on SAC305 solder joints [6,22,23]. It is also noteworthy that the SAC305 macrograins hardness does not exhibit large differences according to the crystallographic orientation.…”
Section: Nanoindentation Testssupporting
confidence: 92%