2007
DOI: 10.1016/j.tsf.2006.12.059
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Study on sulfur diffusion in CuInSe2 thin films using two thermal profiles

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Cited by 6 publications
(2 citation statements)
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“…Looking at the behaviour of similar chalchogenide compounds, it was expected that sulpho-selenides of Cu-Sb metallic precursors would exhibit energy bandgap values lower than the corresponding sulphides, as in the case of CuSb(Se,S)2, CuIn(Se,S)2, Cu(InGa)(S,Se)2 and Cu2ZnSn(Se,S)4 [14,[21][22][23]. In order to reduce the energy bandgap of Cu3SbS3, a combined selenisation and sulphurisation experiment was performed.…”
Section: Combined Sulphurisation/selenisation Of Cu-sb Precursorsmentioning
confidence: 99%
“…Looking at the behaviour of similar chalchogenide compounds, it was expected that sulpho-selenides of Cu-Sb metallic precursors would exhibit energy bandgap values lower than the corresponding sulphides, as in the case of CuSb(Se,S)2, CuIn(Se,S)2, Cu(InGa)(S,Se)2 and Cu2ZnSn(Se,S)4 [14,[21][22][23]. In order to reduce the energy bandgap of Cu3SbS3, a combined selenisation and sulphurisation experiment was performed.…”
Section: Combined Sulphurisation/selenisation Of Cu-sb Precursorsmentioning
confidence: 99%
“…Additionally, one gets the impression that the layer thickness (see figure 4.73 (b,d)) of the thin film is reduced under S in excess, which can be explained by the evaporation of certain Se-species. This behavior is also described in [161] where a two-step mechanism of S incorporation is introduced in a way that at first a chalcogen exchange reaction of the solid-gas interface occurs, followed by an S diffusion in and Se diffusion out of the film. .…”
Section: Influence Of Different T S On the S Incorporation Into Cigsementioning
confidence: 97%