2019
DOI: 10.1109/tns.2019.2898922
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Study on the Effect of Laser Parameters on the SEY of Aluminum Alloy

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Cited by 11 publications
(13 citation statements)
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“…The SEY properties were characterized under normal incidence using a dedicated SEY measurement device which was introduced in Reference [17]. The electron dose for SEY tests was about 7 × 10 −6 C cm −2 , with an electron beam spot size of ~1 mm.…”
Section: Sem and Xps Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The SEY properties were characterized under normal incidence using a dedicated SEY measurement device which was introduced in Reference [17]. The electron dose for SEY tests was about 7 × 10 −6 C cm −2 , with an electron beam spot size of ~1 mm.…”
Section: Sem and Xps Resultsmentioning
confidence: 99%
“…The surface chemical properties of the samples were determined via an AXIS Ultrabld X-ray photoelectron spectroscopy (XPS) with monochromatized Al Ka Xray source. The SEY properties were characterized under normal incidence using a dedicated SEY measurement device which was introduced in Reference [17]. The electron dose for SEY tests was about 7 × 10 −6 C cm −2 , with an electron beam spot size of~1 mm.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…The aluminum alloy substrates were water-jet cut from an ingot and subsequently polished, with the dimensions of 10 mm × 10 mm × 0.5 mm for scanning electron microscope (SEM), laser-scanning confocal microscopy (LSCM, LEXT Olympus OLS4000-SU, Olympus, Tokyo, Japan) and X-ray photoelectron spectroscopy (XPS) tests and 9 mm × 20 mm × 0.5 mm for SEY (introduced in Ref. [17]) measurements. Before initiating film deposition, aluminum alloy, laser-treated aluminum alloy and Si<100> substrates were cleaned with acetone and rinsed with absolute ethyl alcohol for 15 min, respectively, using an ultrasonic cleaning machine.…”
Section: Methodsmentioning
confidence: 99%
“…A Helios Nanolab 600 dual-beam focused ion beam (FIB)-SEM system (FEI, Hillsboro, OR, USA) was employed for localized micro-machining and high-resolution imaging acquisition, which is capable of imaging with a resolution better than 1 nm at 15 kV beam energies. The SEY measurements were determined with the equipment as introduced in reference [17]. The pressure during SEY measurements is usually below 10 −7 Pa.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…Laser processed aluminum alloy was proposed by Wang et al [20] as a prospective option for electron cloud (EC) mitigation, which could be used in the vacuum system of accelerators. The related properties of laser treated metals for EC inhibition were investigated for the past few years, such as the surface resistance of laser treated copper samples [21], the adsorption and desorption properties of laser processed copper [22], and the empirical model of laser treated porous stainless steel surface with gold film coatings [23].…”
Section: Introductionmentioning
confidence: 99%