Study on trap sensitivity for single material gate and double material gate nano-ribbon FETs
Shashank Rai,
Ritu Sharma,
Rajesh Saha
et al.
Abstract:In this work, the trap sensitivity of single material gate (SMG) and dual material gate (DMG) nano ribbon FETs (NRFETs) are reported using TCAD Sentaurus Device simulator. The trap sensitivity is extracted for Gaussian trap distribution of both acceptor and donor type traps. We have reported the trap sensitivity for the variation in trap concentration, energy peak position, work function of metal gate, and temperature for both the NRFETs. It is realized that trap sensitivity is greater and lesser than 100% for… Show more
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