2008
DOI: 10.21123/bsj.5.3.449-453
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Study the effect of thickness and annealing temperature on the Electrical Properties of CdTe thin Films

Abstract: The electrical properties of polycrystalline cadmium telluride thin films of different thickness (200,300,400)nm deposited by thermal evaporation onto glass substrates at room temperature and treated at different annealing temperature (373, 423, 473) K are reported. Conductivity measurements have been showed that the conductivity increases from 5.69X10-5 to 0.0011, 0.0001 (?.cm)-1 when the film thickness and annealing temperature increase respectively. This increasing in ?d.c due to increasing the carrier conc… Show more

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“…This method is one of the classic approximate methods in measuring. The material is weighted using sensitive electrical balance (mentioned in previous paragraph); if the weight of the material is equal to the mass of film and (R) is the distance between the boat and the substrates over which the film will be deposited, the thin film thickness will be according to the relation: (17) t = m / 2π R 2 ρ ----------(1) Where:…”
Section: (B) the Weight Methodmentioning
confidence: 99%
“…This method is one of the classic approximate methods in measuring. The material is weighted using sensitive electrical balance (mentioned in previous paragraph); if the weight of the material is equal to the mass of film and (R) is the distance between the boat and the substrates over which the film will be deposited, the thin film thickness will be according to the relation: (17) t = m / 2π R 2 ρ ----------(1) Where:…”
Section: (B) the Weight Methodmentioning
confidence: 99%