2020
DOI: 10.1007/s10825-020-01537-y
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Studying the switching variability in redox-based resistive switching devices

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Cited by 12 publications
(6 citation statements)
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“…The reset current level approaches a steady plateau with only minor fluctuations as the reset-stop voltage is increased. The space between the tip of the conductive filaments and the electrode, which can vary greatly from cycle to cycle, is smaller at lower reset-stop voltage [ 60 ]. Besides, by employing greater reset-stop voltage, all conductive filaments were ruptured, which is responsible for decreasing the OFF-state resistance.…”
Section: Resultsmentioning
confidence: 99%
“…The reset current level approaches a steady plateau with only minor fluctuations as the reset-stop voltage is increased. The space between the tip of the conductive filaments and the electrode, which can vary greatly from cycle to cycle, is smaller at lower reset-stop voltage [ 60 ]. Besides, by employing greater reset-stop voltage, all conductive filaments were ruptured, which is responsible for decreasing the OFF-state resistance.…”
Section: Resultsmentioning
confidence: 99%
“…Device models that naturally encompass stochasticity do so at the cost of complexity needed to compute the physical scenario in high detail. For example, atomistic KMC simulates switching processes with atomic precision and is inherently stochastic but requires hours of computation per cycle even for small individual cell volumes (e.g., 125 nm 2 Abbaspour et al, 2020 ). At the other end of the spectrum, dynamic models based on numerical solutions of ODE systems are designed to run significantly faster while sometimes aiming to remain physically realistic.…”
Section: Introductionmentioning
confidence: 99%
“…It can be seen a larger C2C spread in the HRS current than in the LRS current. [ 61 ] This higher variability is attributed to the variations of the gap distance between the tip of the broken CF and the metal electrode when the reset process is activated. For statistical analysis, set and reset voltages ( V set and V reset ) and currents ( I set and I reset ) are extracted for each RS cycle of the 3000 experimental cycles.…”
Section: Experimental Evidence Of Variability In Resistive Memoriesmentioning
confidence: 99%
“…According to (61), the coefficient B is asymmetric and can be different for positive and negative values of the driving voltage. Therefore, we should use B ¼ B SET for the voltage values at which the set process occurs (for the structure shown in Figure 21 at V > 0) and B ¼ B RES for the voltage values at which the reset process takes place (for the structure shown in Figure 21 at V < 0).…”
Section: On the Correct Introduction Of A Thermal Noise Sourcementioning
confidence: 99%