2012 Third International Conference on Computing, Communication and Networking Technologies (ICCCNT'12) 2012
DOI: 10.1109/icccnt.2012.6396004
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Sub image based eigen fabrics method using multi-class SVM classifier for the detection and classification of defects in woven fabric

Abstract: Human visual system can identify larger defects taking pl ace on the woven fabric. But it is very difficult to classify and identify the small fabric defects by a human inspector. In the textile industries the defect detection by a human inspector affects the production tremendo usly. Thus this paper gives a solution of this pro blem by developing an automatic fabric defect detection system, based on th e computer vision. Th e sub image based peA method is appl ied for th e extraction of th e feature from th e… Show more

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Cited by 9 publications
(7 citation statements)
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References 12 publications
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“…The study shows that our method can more effectively identify the defects than other studies. Our study achieves a 96.60% defect detection rate; Basu et al [ 31 ] achieved 96.36%, whereas other studies [ 30 , 32 ] achieved less than 95%. Our study also has a greater number of defect types than other studies.…”
Section: Discussioncontrasting
confidence: 42%
See 1 more Smart Citation
“…The study shows that our method can more effectively identify the defects than other studies. Our study achieves a 96.60% defect detection rate; Basu et al [ 31 ] achieved 96.36%, whereas other studies [ 30 , 32 ] achieved less than 95%. Our study also has a greater number of defect types than other studies.…”
Section: Discussioncontrasting
confidence: 42%
“…The defective and defect-free regions of the fabric were shown for five commonly occurring defect types. Basu et al [ 31 ] applied a principal component analysis to extract features from the training and test structure images, and a SVM classifier was used to perform the classification. The images were tested in the TILDA database of fabric defect standards; however, they were static.…”
Section: Introductionmentioning
confidence: 99%
“…Learning-based methods use labelled samples to train classifiers that distinguish between defective and non-defective samples. There are fabric defect detection studies made using classifiers such as the Support Vector Machines (SVM), 30 feedback Artificial Neural Network (ANN), 31 and the Bayes classifier (BC) 8 to learn signatures of defected and non-defected classes. But most of those pattern classification methods need a large variety of data.…”
Section: Related Workmentioning
confidence: 99%
“…Yapi et al 12 proposed using supervised learning to classify defective and flawless fabrics. Basu et al 13 studied fabric defect detection through a support vector machine (SVM) and other classifiers. Han and Xu 14 developed a template matching method from the statistical data of fabric textures and combined it with threshold method to detect small defects.…”
Section: Introductionmentioning
confidence: 99%