2019
DOI: 10.1016/j.apsusc.2019.06.187
|View full text |Cite
|
Sign up to set email alerts
|

Sub-kilogram-scale synthesis of highly dispersible zirconia nanoparticles for hybrid optical resins

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
7
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
6
1

Relationship

2
5

Authors

Journals

citations
Cited by 15 publications
(7 citation statements)
references
References 61 publications
0
7
0
Order By: Relevance
“…A typical graphitic carbon peak appeared for the NG sample at a value of 2θ of 26.5°, related to the (002) plane of the layered graphite material (PDF#12-0210) . The peaks at 30.1 and 34.9° are characteristic of ZrO 2 (PDF#49-1642), which arose from the crushed particles of the zirconium ball used for the Emax grinding process . The other characteristic peaks appearing at 28.4, 47.3, 56.1, and 69.1° in the patterns of the Si, bare-Si/G, SD1-Si/G, and SD2-Si/G samples could be indexed to the typical diffraction peaks of the (111), (220), (311), and (400) lattice planes of crystalline Si (PDF#75-0590) .…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…A typical graphitic carbon peak appeared for the NG sample at a value of 2θ of 26.5°, related to the (002) plane of the layered graphite material (PDF#12-0210) . The peaks at 30.1 and 34.9° are characteristic of ZrO 2 (PDF#49-1642), which arose from the crushed particles of the zirconium ball used for the Emax grinding process . The other characteristic peaks appearing at 28.4, 47.3, 56.1, and 69.1° in the patterns of the Si, bare-Si/G, SD1-Si/G, and SD2-Si/G samples could be indexed to the typical diffraction peaks of the (111), (220), (311), and (400) lattice planes of crystalline Si (PDF#75-0590) .…”
Section: Resultsmentioning
confidence: 99%
“…Through EA, we estimated the total amounts of carbon materials present in the bare-Si/G, SD1-Si/G, and SD2-Si/G composite samples to be 63.43, 68.12, and 67.81 wt %, respectively. Furthermore, we expected the formation of a small amount of amorphous carbon to act as a buffer layer upon the expansion of the silicon particles, potentially helping isolate the silicon and the electrolyte from direct contact while also improving the stability of the interface …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Since the semiconductor chip and the encapsulated material have different refractive index (RI) values. 7,8 Total reflection of light usually occurs at the interface of the chip and the encapsulation material, which limited the light extraction efficiency of the device. 9 Therefore, the value of the RI is reputed as one of the most important indexes while evaluating the encapsulation material or other optical materials.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Solid-state lighting (SSL) is a fast-growing lighting technology that uses semiconductor chips and luminescent materials to directly convert electrical energy into light energy. , Light-emitting diodes (LEDs), as the most common kind of SSL, have been one of the most popular light sources due to the low power consumption and long lifetime. , To take full advantage of quantum efficiency, the improvement of the light extraction efficiency has attracted considerable attention. , A typical LED device is made of a semiconductor chip and an encapsulated layer consisting of organic polymers and inorganic phosphors. Since the semiconductor chip and the encapsulated material have different refractive index (RI) values. , Total reflection of light usually occurs at the interface of the chip and the encapsulation material, which limited the light extraction efficiency of the device . Therefore, the value of the RI is reputed as one of the most important indexes while evaluating the encapsulation material or other optical materials.…”
Section: Introductionmentioning
confidence: 99%