Subatomic Channeling and Helicon-Type Beams in 
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi>SrTiO</mml:mi></mml:mrow><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>

Jeong, Jong Seok; Song, Hosup; Held, Jacob T.; Mkhoyan, K. Andre

doi:10.1103/physrevlett.122.075501

Cited by 2 publications

(6 citation statements)

References 33 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Such beam behavior in the second layer may cause unexpected results in ADF-STEM images as well as in spectroscopic elemental maps. Additionally, in cases of very small misalignment between atomic columns, through-column channeling in the first layer results in sub-atomic channeling in the second layer [29]. It is particularly evident in the depth profiles at the SnO column position in the region ② with clear sub-atomic channeling around the AlO column in the LAO layer ( Fig.…”

Section: -2 Effects Of Probe Locationmentioning

confidence: 91%

“…All the simulations presented here are hence performed using the AlO STEM probe parameters were set as: beam energy of 200 keV, a convergence angle of 20 mrad, and defocus in the range from -8 nm to 32 nm. Cs was set to be 0 as the differences between probes with small, aberration corrected Cs and Cs = 0 are negligible [22,29]. Thermal diffuse scattering was included using frozen-phonon approximation for T = 300 K [23].…”

Section: Simulationmentioning

confidence: 99%

See 1 more Smart Citation

STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

et al. 2020

Self Cite

View full text Add to dashboard Cite

Highlights STEM probe intensity depth profile is simulated to reveal the probe channeling in the BaSnO3/LaAlO3 bilayer. Defocus of a probe and atomic column arrangements in the bilayer modify channeling in a specimen.  Depth of channeling is determined by specifics of examined materials unlike depth of field. Measured and simulated HAADF-and LAADF-STEM images of the BaSnO3/LaAlO3 bilayer visualize the MD network. AbstractA study of the STEM probe channeling in a heterostructured crystalline specimen is presented here with a goal to guide appropriate STEM-based characterization for complex structures. STEM analysis of perovskite BaSnO3/LaAlO3 bilayers is performed and the dominating effects of beam channeling on HAADF-and LAADF-STEM are illustrated. To study the electron beam propagating through BaSnO3/LaAlO3 bilayers, probe intensity depth profiles are calculated, and the effects of probe defocus and atomic column alignment are discussed. Characteristics of the beam channeling are correlated to resulting ADF-STEM images, which is then tested by comparing focal series of plan-view HAADF-STEM images to those recorded experimentally. Additionally, discussions on how to visualize the misfit dislocation network at the BaSnO3/LaAlO3 interface using HAADF-and LAADF-STEM images are provided.2

show abstract

Section: -2 Effects Of Probe Locationmentioning

confidence: 91%

Section: Simulationmentioning

confidence: 99%

STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

et al. 2020

Self Cite

View full text Add to dashboard Cite

show abstract

“…the center of the atomic column and its atomic number (Jeong et al, 2019). The behavior of electron channeling across heterointerfaces and multilayers controls the image contrast of interfacial misfit dislocation networks in STEM-based images (Perovic et al, 1993a(Perovic et al, , 1993bKourkoutis et al, 2011;Oveisi et al, 2019).…”

Section: Electron-beam Channeling and Atomic Focuser In Stemmentioning

confidence: 99%

“…Therefore, the nature of the specimen and the characteristics of the incident electron probe control how the channeling electrons produce the various types of scattered and emitted signals. Simulations of electron channeling at a subatomic length scale (Jeong et al, 2019) demonstrated that subatomic channeling of high-energy electrons could occur and such electron-channeling effects could even produce helicon-type electron beams (Fig. 17).…”

Section: The Development Of Stem Imaging Theorymentioning

confidence: 99%

“…The subatomic channeling condition is different from that for on-column channeling. The frequency of the oscillating waves depends on the probe position relative to the center of the atomic column and its atomic number (Jeong et al, 2019). The behavior of electron channeling across hetero-interfaces and multilayers controls the image contrast of interfacial misfit dislocation networks in STEM-based images (Perovic et al, 1993 a , 1993 b ; Kourkoutis et al, 2011; Oveisi et al, 2019).…”

Section: The Development Of Stem Imaging Theorymentioning

confidence: 99%

See 1 more Smart Citation

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Liu

2021

Microsc Microanal

View full text Add to dashboard Cite

Although scanning transmission electron microscopy (STEM) images of individual heavy atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging became wide spread only after the practical realization of aberration correctors on field-emission STEM/TEM instruments to form sub-Ångstrom electron probes. The innovative designs and advances of electron optical systems, the fundamental understanding of electron–specimen interaction processes, and the advances in detector technology all played a major role in achieving the goal of atomic-resolution STEM imaging of practical materials. It is clear that tremendous advances in computer technology and electronics, image acquisition and processing algorithms, image simulations, and precision machining synergistically made atomic-resolution STEM imaging routinely accessible. It is anticipated that further hardware/software development is needed to achieve three-dimensional atomic-resolution STEM imaging with single-atom chemical sensitivity, even for electron-beam-sensitive materials. Artificial intelligence, machine learning, and big-data science are expected to significantly enhance the impact of STEM and associated techniques on many research fields such as materials science and engineering, quantum and nanoscale science, physics and chemistry, and biology and medicine. This review focuses on advances of STEM imaging from the invention of the field-emission electron gun to the realization of aberration-corrected and monochromated atomic-resolution STEM and its broad applications.

show abstract

Subatomic Channeling and Helicon-Type Beams in SrTiO3

Cited by 2 publications

References 33 publications

STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Contact Info

Product

Resources

About