Submicron bubble domain device design

George, P. K.; Hughes, A. J.; Archer, J. L.

doi:10.1109/tmag.1974.1058398

Cited by 19 publications

(3 citation statements)

References 4 publications

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“…6. However the H,./ 41TM values for the amorphous films are only 0.1 % for I 0.05, and are not expected to pose any problem for T-I bar type devices in which the predominant term defining the minimum propagation field is due to the magnetization of the film [8,9]. The higher coercivities could be of concern in other devices.…”

Section: Coercivity and Mobilitymentioning

confidence: 97%

“…4. In general, minimizing the power required to propagate the bubbles requires minimizing the coercivity He' However, in T-I bar type devices the lowest practical rotating field for bubble propagation depends strongly on M as a result of interbar gaps [8,9]. Thus propagating power is negligibly increased even if He is as large as one percent of 41rM.…”

Section: General Considerationsmentioning

confidence: 99%

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Amorphous Materials for Micrometer and Submicrometer Bubble Domain Technology

Bajorek

Kobliska

1976

IBM J. Res. & Dev.

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A review and critique is made of those material and processing issues that pertain to the implementation of micrometer and subrnicrometer bubble devices on amorphous films. Adequate reproducibility and uniformity have been achieved in ternary amorphous films prepared by rf sputtering and their magnetic characteristics are very similar to those of analogous garnet films. Factors that may limit application to the amorphous films include defects and dielectric breakdown in insulating layers, sensitivity to annealing, and larger, but not prohibitive, coercivities. A salient problem common to both garnet and amorphous materials is attainment of sufficiently large values of Q to ensure stable device operation.

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Section: Coercivity and Mobilitymentioning

confidence: 97%

Section: General Considerationsmentioning

confidence: 99%

Amorphous Materials for Micrometer and Submicrometer Bubble Domain Technology

Bajorek

Kobliska

1976

IBM J. Res. & Dev.

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“…2, assure propagation of the bubble across the gap and satisfy certain upper and lower bounds on the circuit parameters. Both sand HT are allowed to vary in the ranges: 0.05 < s S. 0.45 ~m 1200 ~ HT S. 5000 Aim (7 ) (8) while all the other parameters are kept fixed at the values shown in Fig. 2.…”

Section: Quasistatic Operation With a Bias Margin Of About 2400mentioning

confidence: 99%

The optimum design of magnetic bubble propagation circuits

Ishak

Torre

1979

Journal of Applied Physics

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This paper describes a procedure for the optimal design of field access bubble propagation circuits. Each type of propagation circuit is described by the assignment of a set of parameters. An objective function of these parameters is formulated to describe the ideal to be achieved. An optimization procedure is applied to the objective to compute the set of optimum parameters. Various objectives can be used, one such is: maximizing the speed of the device by maximizing the propagating potential-well gradients, and minimizing bubble size fluctuations by adjusting the potential-well profile. The optimization package used permits the application of constraints on the circuit parameters such as the assuring of propagation past critical points in the circuit and limiting the parameters to realistic ranges. An example is given to show the results of optimizing the performance of a T-! propagation circuit.PACS numbers: 75.70.Kw J.

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