working devices where the band edge of the metallic contacts (typically aluminum and Indium tin oxide (ITO)) has been aligned to the highest occupied molecular orbital (HOMO)/ lowest unoccupied molecular orbital (LUMO) of the semiconductor to increase carrier injection and extraction effi ciency. However, the equilibrium Fermi level of the organic semiconductor is usually mid way between the HOMO-LUMO level, and far from that of the ITO or aluminum contact. This means for the system to reach equilibrium, and for the quasi-Fermi levels of the metal and semiconductor to align, a signifi cant number of both electrons and holes must be injected from the contacts into the bulk of the organic semiconductor, resulting in a large equilibrium background carrier population. The nongeminate recombination rate ( R ) in organic semiconductors is known to be a strong function of both local electron ( n ( x )) and local hole carrier ( p ( x )) densities, [ 20 ] ( ), , , [ 29,30 ] where k is a constant of proportionality and x is the position. Thus if the local background charge density of either species could be reduced, so would the recombination rate. Furthermore, if photogenerated electrons could be quickly swept from hole rich regions, and photogenerated holes from electron rich regions, the spatial overlap of the photogenerated populations would be reduced and charge carrier lifetime would also be increased.In the following pages we demonstrate that by engineering the band structure in a plastic electronic device, hole carrier lifetimes longer than 1 hour can be achieved. We attribute this four order of magnitude increase in carrier lifetime to a hill shaped band structure which forces photogenerated electrons and holes to spatially separate shortly after generation, the reduction in spatial overlap between the electron and hole population reduces the recombination rate. The hill shaped band structure also generates a hole rich and electron poor region in the center of the device in which the hole recombination rate is low, this acts as a charge storage area. These results demonstrate that it is possible for organic semiconductors to have long charge carrier lifetimes, and opens up the possibility for new classes of ultra low light level photodetectors and memory elements.Figure 1 a depicts the device structure; it consists of an ITO coated glass substrate with contact resistance 30 Ω sq −1 . An insulating layer of SiO 2 is spin coated from a sol-gel onto the ITO fi lm, followed by a layer of the organic semiconductor N,N′-Di-[(1-naphthyl)-N,N′-diphenyl]-1,1′-biphenyl)-4,4′-diamine (NPB). Finally a 30 nm thick aluminum capping electrode is evaporated onto the NPB. Full details of device fabrication can be found in the Supporting Information. Charge is stored within the device by photoexcitation through the transparent ITO contact using a 355 nm laser with a 10 ns pulse Plastic electronic devices fabricated from carbon based molecules and polymers [ 1 ] have received considerable academic and industrial attention over the l...