2017
DOI: 10.1109/tmtt.2017.2709745
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Substrate Integrated Waveguide Filters Based on a Dielectric Layer With Periodic Perforations

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Cited by 46 publications
(21 citation statements)
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“…The depth of the rejected band is related to the order of the filter, as stated in the study performed in [7]. By increasing the number of the filter sections, the value of that parameter can be increased.…”
Section: B Depth Of the Rejected Bandmentioning
confidence: 99%
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“…The depth of the rejected band is related to the order of the filter, as stated in the study performed in [7]. By increasing the number of the filter sections, the value of that parameter can be increased.…”
Section: B Depth Of the Rejected Bandmentioning
confidence: 99%
“…The new filters based on SIW with Alternating Dielectric Line Sections (ADLS) [6] have properties between the ones of SIW and ESIW filters in terms of size and insertion loss. Furthermore, these structures can control the rejection band by changing the dielectric permittivity and/or filter order [7].…”
Section: Introductionmentioning
confidence: 99%
“…However, the recent demands of the microwave industry enforce the development of miniaturized, integrated technology compatible planar structures, which limits the applicability of bulky metallic cavity. The advent of the planar substrate integrated waveguide (SIW) technology-based structure is found to be a viable option to fulfill the various earlier mentioned demands [13][14][15]. That is the main reason that the design and implementation of planar SIW structure-based devices have grown at a rapid pace in recent years in place of metallic waveguides and cavities [14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%
“…The advent of the planar substrate integrated waveguide (SIW) technology-based structure is found to be a viable option to fulfill the various earlier mentioned demands [13][14][15]. That is the main reason that the design and implementation of planar SIW structure-based devices have grown at a rapid pace in recent years in place of metallic waveguides and cavities [14][15][16][17]. However, the literature available SIW cavity dielectric sensor mainly employs the conventional small material perturbation formulation [18,19] which only better suited for the metallic cavity [12].…”
Section: Introductionmentioning
confidence: 99%
“…Among them, a widely used solution is based on direct-coupled cavity resonators [2]. An alternative SIW filtering structure has been recently proposed in [3], based on the periodic perforation of the dielectric substrate with air holes in a constant width structure. Being a very promising solution, it has some fabrication issues related to the requested number (and dimensions) of perforated holes.…”
Section: Introductionmentioning
confidence: 99%