Substrate resistance extraction with direct boundary element method

Wang, Xiren; Yu, Wenjian; Wang, Zeyi

doi:10.1145/1120725.1120806

Cited by 5 publications

(11 citation statements)

References 14 publications

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“…For a structure (see Figure 1 of [17]), to make the compressing practical, we reorder the variable v 33 within the top layer as:…”

Section: Compress the Linear Systemmentioning

confidence: 99%

An improved direct boundary element method for substrate coupling resistance extraction

Wang

et al. 2005

Proceedings of the 15th ACM Great Lakes Symposium on VLSI

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It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents an improved direct boundary element method (DBEM) for substrate resistance calculation, where only the boundary of substrate volumes is discretized and only the free-space Green function is used. At first, we discard some inessential unknowns to compress the linear system without accuracy loss. Then we make the coefficient matrix sparser. In this way, solving the linear system is greatly accelerated. Experiments on various substrates validate that DBEM is several to tens of times faster than DCT-accelerated Green's function methods and the eigendecomposition method, while preserving high accuracy. Besides, another experiment shows that this method is versatile for irregular substrates.

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“…For a structure (see Figure 1 of [17]), to make the compressing practical, we reorder the variable v 33 within the top layer as:…”

Section: Compress the Linear Systemmentioning

confidence: 99%

An improved direct boundary element method for substrate coupling resistance extraction

Wang

et al. 2005

Proceedings of the 15th ACM Great Lakes Symposium on VLSI

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“…In this paper, the direct boundary element method (DBEM) [12,13] is improved for efficient extraction of the parameters. DBEM is used to get the substrate resistance [12]. This is performed only one time.…”

Section: Introductionmentioning

confidence: 99%

“…in medium Mi (2) The potential and the conductance current are continuous across medium interfaces: 1 (4zcr), where r is the distance between point s and a source point [12]. q* is the normal derivative.…”

Section: Introductionmentioning

confidence: 99%

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A New Boundary Element Method for Multiple-Frequency Parameter Extraction of Lossy Substrates

Wang

2007

2007 Asia and South Pacific Design Automation Conference

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The couplings via realistic lossy substrates can be modeled as frequency-dependent coupling parameters. The fast extraction at multiple frequencies can be accomplished in two sequent steps. The first is to extract the coupling resistance using a direct boundary element method (DBEM). The second is to revise the resistance into the parameter at the frequency in an exact and rapid way. The first step is time-consuming, while it runs only one time; the second repeats at each frequency, but is much easier. For more frequency calculation, this method is more advanced. Numerical experiments illustrate that this method has high accuracy, and it can be hundreds of times faster than an advanced Green's function based method. Substrates with arbitrary doping profiles can also be easily handled, which is partly verified by experiment.

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“…High-speed digital components and highly-sensitive analog components are often built on a common substrate. Although the high integration has some advantages, such as low power dissipation [2], there is a problem that the current noises injected by digital components travel the shared substrate and impact sensitive analog components severely [3]. Besides, substrate losses also impact circuit performances considerably.…”

Section: Introductionmentioning

confidence: 99%

A new boundary element method for accurate modeling of lossy substrates with arbitrary doping profiles

Wang¹,

Yu²,

Wang³

Asia and South Pacific Conference on Design Automation, 2006.

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It is important to model substrate couplings for SoC/mixed-signal circuit designs. After introducing the continuation equation of full current in lossy substrates, we present a new direct boundary element method (DBEM), which can handle the substrates with arbitrary doping profiles. Three techniques can speed up the DBEM remarkably, which include reusing coefficient matrices for multiple-frequency calculation, condensing the linear system, and sparsifying coefficient matrix. Numerical experiments illustrate that DBEM has high accuracy and high efficiency, and is versatile for arbitrary doping profiles.

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Substrate resistance extraction with direct boundary element method

Cited by 5 publications

References 14 publications

An improved direct boundary element method for substrate coupling resistance extraction

An improved direct boundary element method for substrate coupling resistance extraction

A New Boundary Element Method for Multiple-Frequency Parameter Extraction of Lossy Substrates

A new boundary element method for accurate modeling of lossy substrates with arbitrary doping profiles

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