Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005.
DOI: 10.1109/ipfa.2005.1469127
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Successful fault isolation of bit line leakage and leakage suppression by ILD optimization in embedded flash memory

Nam Sung Kim1,
Yang Bum Lee2,
Wong Wing Yew3
et al.
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