1999
DOI: 10.1103/physrevb.60.r2139
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Sulfur: A donor dopant forn-type diamond semiconductors

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Cited by 208 publications
(86 citation statements)
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“…However, there is a lack of clarity in the role of sulfur in these materials. For example, it seems clear that early reports [112,113] of shallow donors with an activation energy of 0.38 eV actually relate to p-type conduction from the acceptor level of substitutional boron unintentionally incorporated due to contamination from the CVD reactor [114].…”
Section: Chalcogen Donorsmentioning
confidence: 97%
“…However, there is a lack of clarity in the role of sulfur in these materials. For example, it seems clear that early reports [112,113] of shallow donors with an activation energy of 0.38 eV actually relate to p-type conduction from the acceptor level of substitutional boron unintentionally incorporated due to contamination from the CVD reactor [114].…”
Section: Chalcogen Donorsmentioning
confidence: 97%
“…This means that dopants which are routinely used to n-dope Si, such as P or As, cannot easily be used for diamond. The development of a successful n-doping process has taken a considerable time, and only very recently have a few reports appeared from a group in NIRIM claiming success in this area (Koizumi et al 1998;Sakaguchi et al 1999). Despite these difficulties, diamond-based devices are gradually beginning to appear, and may become the material of choice for electronic applications involving high power and/or high temperature.…”
Section: P W Maymentioning
confidence: 99%
“…Many researchers have studied dopants including nitrogen, sulfur, oxygen and phosphorous inserted into single or polycrystalline diamond by ion-implantation or growth during chemical vapour deposition (CVD) process. [1][2][3] Substitutional nitrogen acted as donors that caused electrical conduction with an activation energy of ≈1.7 eV in natural diamond, which was too high for room-temperature activation. 4 Studies on diamond-containing phosphorous donors showed that the activation energy for conduction was 0.4-0.6 eV.…”
mentioning
confidence: 99%