1997
DOI: 10.1557/proc-485-203
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Sulfur Diffusion In Polycrystalline Thin-Film CdTe Solar Cells

Abstract: X-ray diffraction and photoluminescence measurements have been used to characterize the diffusion of S into CdTe during post growth annealing of CdTe solar cells. For anneals at 410°C in the presence of CdCl2, evidence that both a CdTe1 xSx phase and nearly-pure CdTe are present near the back contact is observed. The ternary phase becomes more prominent and the S concentration increases with depth reaching roughly 4–5% near the CdS interface. Much less diffusion is observed at 350°C while for a 460°C anneal, C… Show more

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Cited by 5 publications
(1 citation statement)
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“…3 Several studies have focused on improving the effi ciency of CdTebased solar cells by reducing crystal defects and optimizing interface properties between CdTe and its complementary cell material. [4][5][6][7][8] Recently, fullerenes have been proposed for materials to be used in photovoltaic applications. 9 The motivation for photovoltaic applications of fullerenes arises from the high photoconductivity values observed in C 60 and the strong acceptor properties of fullerenes.…”
Section: Introductionmentioning
confidence: 99%
“…3 Several studies have focused on improving the effi ciency of CdTebased solar cells by reducing crystal defects and optimizing interface properties between CdTe and its complementary cell material. [4][5][6][7][8] Recently, fullerenes have been proposed for materials to be used in photovoltaic applications. 9 The motivation for photovoltaic applications of fullerenes arises from the high photoconductivity values observed in C 60 and the strong acceptor properties of fullerenes.…”
Section: Introductionmentioning
confidence: 99%